8HAU

NARROW LEAF 1 from Indica


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d4.423
f_angle_d0.684
f_chiral_restr0.047
f_bond_d0.005
f_plane_restr0.004
Sample
NARROW LEAF 1 from Indica
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification DetailsVitrification carried out in Ethane
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles1273195
Reported Resolution (Å)3.02
Resolution MethodFSC 0.143 CUT-OFF
Other DetailsThe version 4.0.2 of the cryoSPARC program was used for the reconstruction
Refinement Type
Symmetry TypePOINT
Point SymmetryD3
Map-Model Fitting and Refinement
Id1
Refinement SpaceREAL
Refinement ProtocolAB INITIO MODEL
Refinement Target
Overall B Value192.4
Fitting Procedure
DetailsInitial local fitting was done using ChimeraX
Data Acquisition
Detector TypeGATAN K3 (6k x 4k)
Electron Dose (electrons/Å**2)50
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TALOS ARCTICA
Minimum Defocus (nm)1000
Maximum Defocus (nm)2500
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification57000
Calibrated Magnification57000
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)200
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARC4.0.2
CTF CORRECTIONcryoSPARC4.0.2
MODEL FITTINGcryoSPARC4.0.2
MODEL REFINEMENTcryoSPARC4.0.2
INITIAL EULER ASSIGNMENTcryoSPARC4.0.2
FINAL EULER ASSIGNMENTcryoSPARC4.0.2
CLASSIFICATIONcryoSPARC4.0.2
RECONSTRUCTIONcryoSPARC4.0.2
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTIONCTF amplitude correction wae performed following 3D reconstruction2347148