2ZHC
ParM filament
ELECTRON MICROSCOPY
Starting Model(s)
Initial Refinement Model(s) | |||
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Type | Source | Accession Code | Details |
experimental model | PDB | 1MWM |
Sample |
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ParM filament |
Specimen Preparation | |
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Sample Aggregation State | FILAMENT |
Staining Type | NEGATIVE |
Staining Material | Uranyl Acetate |
Staining Details |
3D Reconstruction | |
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Reconstruction Method | HELICAL |
Number of Particles | 2085 |
Reported Resolution (Å) | 23 |
Resolution Method | |
Other Details | This data was achieved by negative staining experiments |
Refinement Type | |
Symmetry Type | HELICAL |
Map-Model Fitting and Refinement | |||||
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Id | 1 (1MWM) | ||||
Refinement Space | |||||
Refinement Protocol | |||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details |
Data Acquisition | |||||||||
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Detector Type | GENERIC FILM | ||||||||
Electron Dose (electrons/Å**2) | 12 |
Imaging Experiment | 1 |
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Date of Experiment | 2007-01-01 |
Temperature (Kelvin) | 300 |
Microscope Model | JEOL 2010HC |
Minimum Defocus (nm) | 3700 |
Maximum Defocus (nm) | 10300 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | |
Nominal Magnification | 40000 |
Calibrated Magnification | |
Source | LAB6 |
Acceleration Voltage (kV) | 100 |
Imaging Details |
EM Software | ||
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Task | Software Package | Version |
RECONSTRUCTION | EOS |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
Phase and Amplitude |