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Endogenous Pfs230D13-14 in complex with Pfs48/45 bound to anti-Pfs48/45 Fabs RUPA-71 and RUPA-44
Starting Model(s) Initial Refinement Model(s) Type Source Accession Code Details experimental model PDB 8U1P experimental model PDB 7UXL experimental model PDB 9N7K
Refinement RMS Deviations Key Refinement Restraint Deviation f_dihedral_angle_d 4.883 f_angle_d 0.529 f_chiral_restr 0.046 f_plane_restr 0.004 f_bond_d 0.003
Sample Endogenous Pfs230 in complex with Pfs48/45 bound to anti-Pfs48/45 Fabs RUPA-71 and RUPA-44
Specimen Preparation Sample Aggregation State PARTICLE Vitrification Instrument LEICA EM GP Cryogen Name ETHANE Sample Vitrification Details The Leica Automatic Plunge Freezer EM GP2 was used for freezing.
3D Reconstruction Reconstruction Method SINGLE PARTICLE Number of Particles 146814 Reported Resolution (Å) 3.39 Resolution Method FSC 0.143 CUT-OFF Other Details Refinement Type Symmetry Type POINT Point Symmetry C1
Map-Model Fitting and Refinement Id 1 (8U1P, 7UXL, 9N7K) Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type TFS FALCON 4i (4k x 4k) Electron Dose (electrons/Å**2) 52
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model TFS KRIOS Minimum Defocus (nm) 800 Maximum Defocus (nm) 2300 Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode BRIGHT FIELD Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER Nominal Magnification 130000 Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 300 Imaging Details
EM Software Task Software Package Version PARTICLE SELECTION cryoSPARC v4.6.0 IMAGE ACQUISITION EPU CTF CORRECTION cryoSPARC v4.6.0 MODEL FITTING UCSF ChimeraX 1.9 INITIAL EULER ASSIGNMENT cryoSPARC v4.6.0 FINAL EULER ASSIGNMENT cryoSPARC v4.6.0 CLASSIFICATION cryoSPARC v4.6.0 RECONSTRUCTION cryoSPARC v4.6.0 MODEL REFINEMENT PHENIX 1.21.1_5286 MODEL REFINEMENT Coot
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING AND AMPLITUDE CORRECTION