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Straight and symmetrical filament of the spirochete periplasmic flagella of Leptospira biflexa deleted fcpB strain
Refinement RMS Deviations Key Refinement Restraint Deviation f_dihedral_angle_d 4.569 f_angle_d 0.492 f_chiral_restr 0.037 f_bond_d 0.003 f_plane_restr 0.003
Sample Straight and symmetrical filament of the spirochete periplasmic flagella from deleted fcpB strain
Specimen Preparation Sample Aggregation State FILAMENT Vitrification Instrument FEI VITROBOT MARK IV Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method HELICAL Number of Particles 203738 Reported Resolution (Å) 2.4 Resolution Method FSC 0.143 CUT-OFF Other Details Refinement Type Symmetry Type HELICAL Axial Symmetry C1 Axial Rise 4.81 Angular Rotation 65.439
Map-Model Fitting and Refinement Id 1 Refinement Space REAL Refinement Protocol FLEXIBLE FIT Refinement Target Overall B Value 50.5914 Fitting Procedure Details
Data Acquisition Detector Type FEI FALCON III (4k x 4k) Electron Dose (electrons/Å**2) 50
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model TFS KRIOS Minimum Defocus (nm) 500 Maximum Defocus (nm) 2000 Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS 0.01 Imaging Mode BRIGHT FIELD Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER Nominal Magnification 59000 Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 300 Imaging Details
EM Software Task Software Package Version IMAGE ACQUISITION EPU CTF CORRECTION Gctf MODEL FITTING Coot INITIAL EULER ASSIGNMENT RELION 3.1.3 FINAL EULER ASSIGNMENT RELION 3.1.3 CLASSIFICATION RELION 3.1.3 RECONSTRUCTION RELION 3.1.3 MODEL REFINEMENT PHENIX 1.21.1_5286
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING ONLY