ELECTRON CRYSTALLOGRAPHY

Starting Model(s)

Initial Refinement Model(s)
TypeSourceAccession CodeDetails
in silico modelAlphaFoldA0A4U9RR22 

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 65.79α = 90
b = 106.07β = 90
c = 149.28γ = 90
Symmetry
Space GroupP 2 21 21

Data Collection

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeMean Isotropic B
ELECTRON CRYSTALLOGRAPHYFREE R-VALUE2.549.431966158986.540.23960.23790.272624.69
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d13.4871
f_angle_d0.5461
f_chiral_restr0.0426
f_plane_restr0.0041
f_bond_d0.0024
Sample
Clostripain
Specimen Preparation
Sample Aggregation State3D ARRAY
Vitrification InstrumentLEICA EM GP
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodCRYSTALLOGRAPHY
Number of Particles
Reported Resolution (Å)2.5
Resolution MethodDIFFRACTION PATTERN/LAYERLINES
Other Details
Refinement Type
Symmetry Type3D CRYSTAL
Space Group Name
Length a65.79
Length b106.07
Length c106.07
Angle Alpha90
Angle Beta90
Angle Gamma90
Map-Model Fitting and Refinement
Id1
Refinement SpaceRECIPROCAL
Refinement ProtocolFLEXIBLE FIT
Refinement Target
Overall B Value24.7
Fitting Procedure
Details
Data Acquisition
Detector TypeFEI FALCON IV (4k x 4k)
Electron Dose (electrons/Å**2)0.04
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)
Maximum Defocus (nm)
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeDIFFRACTION
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
IMAGE ACQUISITIONEPU
MODEL FITTINGPHENIX1.21.1_5286
MODEL REFINEMENTPHENIX1.21.1_5286
MOLECULAR REPLACEMENTPHENIX1.21.1_5287
CRYSTALLOGRAPHY MERGINGXSCALEJun 30, 2023
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
NONE