8VIE

2-PPA bound human TMEM175


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d3.273
f_angle_d0.45
f_chiral_restr0.035
f_bond_d0.003
f_plane_restr0.003
Sample
human TMEM175 in an inhibitor-bound state
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification DetailsBlot for 4 seconds prior to plunging
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles198393
Reported Resolution (Å)3.52
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Map-Model Fitting and Refinement
Id1
Refinement SpaceREAL
Refinement ProtocolOTHER
Refinement TargetFSC
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å**2)61
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)1200
Maximum Defocus (nm)2500
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONRELION3.1
CTF CORRECTIONCTFFIND4.1.13
MODEL FITTINGPHENIXdev-3751
FINAL EULER ASSIGNMENTcryoSPARC2.12
CLASSIFICATIONcryoSPARC2.12
RECONSTRUCTIONcryoSPARC2.12
MODEL REFINEMENTPHENIXdev-3751
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION3547408