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MutSbeta-ATPgS with kinked MSH2 clamp
Refinement RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 35.531 r_long_range_B_refined 25.61 r_dihedral_angle_3_deg 20.16 r_dihedral_angle_4_deg 19.066 r_mcangle_it 11.366 r_scbond_it 6.874 r_mcbond_it 6.633 r_dihedral_angle_1_deg 5.234 r_angle_refined_deg 1.059 r_chiral_restr 0.089
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 35.531 r_long_range_B_refined 25.61 r_dihedral_angle_3_deg 20.16 r_dihedral_angle_4_deg 19.066 r_mcangle_it 11.366 r_scbond_it 6.874 r_mcbond_it 6.633 r_dihedral_angle_1_deg 5.234 r_angle_refined_deg 1.059 r_chiral_restr 0.089 r_bond_refined_d 0.004 r_gen_planes_refined 0.004 r_bond_other_d r_angle_other_deg r_gen_planes_other r_nbd_refined r_nbd_other r_nbtor_refined r_nbtor_other r_xyhbond_nbd_refined r_xyhbond_nbd_other r_metal_ion_refined r_metal_ion_other r_symmetry_vdw_refined r_symmetry_vdw_other r_symmetry_hbond_refined r_symmetry_hbond_other r_symmetry_metal_ion_refined r_symmetry_metal_ion_other r_mcbond_other r_mcangle_other r_scbond_other r_scangle_it r_scangle_other r_long_range_B_other r_rigid_bond_restr r_sphericity_free r_sphericity_bonded
Sample MutSbeta-ATPgS complex
Specimen Preparation Sample Aggregation State PARTICLE Vitrification Instrument Cryogen Name ETHANE-PROPANE Sample Vitrification Details
3D Reconstruction Reconstruction Method SINGLE PARTICLE Number of Particles 168225 Reported Resolution (Å) 3.02 Resolution Method FSC 0.143 CUT-OFF Other Details Refinement Type Symmetry Type POINT
Map-Model Fitting and Refinement Id 1 Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type FEI FALCON IV (4k x 4k) Electron Dose (electrons/Å**2) 49.98
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model TFS GLACIOS Minimum Defocus (nm) 700 Maximum Defocus (nm) 2500 Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode OTHER Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 200 Imaging Details
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING AND AMPLITUDE CORRECTION