8OV6

Ternary structure of intramolecular bivalent glue degrader IBG1 bound to BRD4 and DCAF16:DDB1deltaBPB


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d4.9386
f_angle_d0.5047
f_chiral_restr0.0418
f_plane_restr0.0042
f_bond_d0.0025
Sample
Ternary complex of bivalent glue degrader compound 1 bound to BRD4 and DCAF16:DDB1deltaBPB
Sample Components
DCAF16:DDB1deltaBPB E3 ligase substrate receptor:apator complex
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification Details3.5 uL complex was dispensed onto the grid, allowed to disperse for 10 s, blotted for 3.5 s using blot force 3, then plunged into liquid ethane
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles192014
Reported Resolution (Å)3.77
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Map-Model Fitting and Refinement
Id1 (5FQD, 3MXF, 6DUV)
Refinement Space
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeTFS FALCON 4i (4k x 4x)
Electron Dose (electrons/Å**2)12.7
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelTFS GLACIOS
Minimum Defocus (nm)1700
Maximum Defocus (nm)3200
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification190000
Calibrated Magnification190000
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)200
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARC4.1.2
IMAGE ACQUISITIONEPU3.0
CTF CORRECTIONcryoSPARC4.1.2
MODEL FITTINGPHENIX1.20.1-4487
INITIAL EULER ASSIGNMENTcryoSPARC4.1.2
FINAL EULER ASSIGNMENTcryoSPARC4.2.1
RECONSTRUCTIONcryoSPARC
MODEL REFINEMENTPHENIX1.20.1-4487
MODEL REFINEMENTUCSF ChimeraX1.6.dev202302040126
MODEL REFINEMENTISOLDE1.6.dev1
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION