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Cryo-EM structure of the J-K-St region of EMCV IRES in complex with eIF4G-HEAT1 and eIF4A (J-K-St/eIF4G focused)
Refinement RMS Deviations Key Refinement Restraint Deviation r_long_range_B_refined 49.777 r_long_range_B_other 49.776 r_scangle_other 36.898 r_mcangle_it 32.81 r_mcangle_other 32.806 r_scbond_it 23.221 r_scbond_other 23.217 r_dihedral_angle_3_deg 22.21 r_mcbond_it 21.304 r_mcbond_other 21.263
RMS Deviations Key Refinement Restraint Deviation r_long_range_B_refined 49.777 r_long_range_B_other 49.776 r_scangle_other 36.898 r_mcangle_it 32.81 r_mcangle_other 32.806 r_scbond_it 23.221 r_scbond_other 23.217 r_dihedral_angle_3_deg 22.21 r_mcbond_it 21.304 r_mcbond_other 21.263 r_dihedral_angle_1_deg 4.309 r_dihedral_angle_2_deg 2.339 r_angle_refined_deg 1.111 r_angle_other_deg 0.444 r_chiral_restr 0.057 r_bond_refined_d 0.005 r_gen_planes_refined 0.004 r_gen_planes_other 0.001 r_bond_other_d r_dihedral_angle_4_deg r_nbd_refined r_nbd_other r_nbtor_refined r_nbtor_other r_xyhbond_nbd_refined r_xyhbond_nbd_other r_metal_ion_refined r_metal_ion_other r_symmetry_vdw_refined r_symmetry_vdw_other r_symmetry_hbond_refined r_symmetry_hbond_other r_symmetry_metal_ion_refined r_symmetry_metal_ion_other r_scangle_it r_rigid_bond_restr r_sphericity_free r_sphericity_bonded
Sample Ternary complex of the J-K-St region of EMCV IRES with eIF4A and eIF4G-HEAT1
Specimen Preparation Sample Aggregation State PARTICLE Vitrification Instrument FEI VITROBOT MARK IV Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method SINGLE PARTICLE Number of Particles 255256 Reported Resolution (Å) 3.7 Resolution Method FSC 0.143 CUT-OFF Other Details Refinement Type Symmetry Type POINT Point Symmetry C1
Map-Model Fitting and Refinement Id 1 Refinement Space REAL Refinement Protocol Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type GATAN K2 SUMMIT (4k x 4k) Electron Dose (electrons/Å**2) 71.1
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model JEOL CRYO ARM 300 Minimum Defocus (nm) 1000 Maximum Defocus (nm) 2500 Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS 3.4 Imaging Mode BRIGHT FIELD Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 300 Imaging Details The microscope model is the JEOL's "JEM-Z320FHC", the custom-built model equipped with a helium-cooled specimen stage.
EM Software Task Software Package Version PARTICLE SELECTION Gautomatch IMAGE ACQUISITION SerialEM CTF CORRECTION Gctf MODEL FITTING UCSF Chimera MODEL FITTING Coot MODEL REFINEMENT PHENIX INITIAL EULER ASSIGNMENT RELION 3.1 FINAL EULER ASSIGNMENT RELION 3.1 CLASSIFICATION RELION 3.1 RECONSTRUCTION RELION 3.1
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING AND AMPLITUDE CORRECTION 947392