8I6J

The focused refinement of CCT3-PhLP2A from TRiC-PhLP2A complex in the open state


ELECTRON MICROSCOPY

Starting Model(s)

Initial Refinement Model(s)
TypeSourceAccession CodeDetails
experimental modelPDB 6NR8 

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d7.293
f_angle_d0.684
f_chiral_restr0.046
f_plane_restr0.004
f_bond_d0.003
Sample
Complex of TRiC/CCT and PhLP2A
Sample Components
PhLP2A (PDCL3)
TRiC/CCT
Specimen Preparation
Sample Aggregation State2D ARRAY
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles359533
Reported Resolution (Å)3.82
Resolution MethodFSC 0.143 CUT-OFF
Other DetailsFocused refinement map for CCT3 and PhLP2A complex
Refinement Type
Symmetry TypePOINT
Map-Model Fitting and Refinement
Id1 (6NR8)
Refinement SpaceREAL
Refinement ProtocolFLEXIBLE FIT
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeFEI FALCON IV (4k x 4k)
Electron Dose (electrons/Å**2)50
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)1000
Maximum Defocus (nm)2000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARC3.2.0
CTF CORRECTIONcryoSPARC3.2.0
MODEL FITTINGUCSF Chimera1.15
MODEL REFINEMENTPHENIX1.19
MODEL REFINEMENTCoot0.9.6
INITIAL EULER ASSIGNMENTcryoSPARC3.2.0
FINAL EULER ASSIGNMENTcryoSPARC3.2.0
CLASSIFICATIONcryoSPARC3.2.0
RECONSTRUCTIONcryoSPARC3.2.0
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
NONECTF correction was performed for every micrographs2691733The initial particle selection after 2D class classification