8I48
Cryo-EM structure of nanodisc (PE:PS:PC) reconstituted GLIC at pH 4 in closed state
ELECTRON MICROSCOPY
Refinement
RMS Deviations | |
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Key | Refinement Restraint Deviation |
f_dihedral_angle_d | 16.18 |
f_angle_d | 0.622 |
f_chiral_restr | 0.044 |
f_plane_restr | 0.005 |
f_bond_d | 0.004 |
Sample |
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pentameric ligand-gated ion channel |
Specimen Preparation | |
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Sample Aggregation State | PARTICLE |
Vitrification Instrument | FEI VITROBOT MARK IV |
Cryogen Name | ETHANE |
Sample Vitrification Details |
3D Reconstruction | |
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Reconstruction Method | SINGLE PARTICLE |
Number of Particles | 254591 |
Reported Resolution (Å) | 2.74 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | |
Refinement Type | |
Symmetry Type | POINT |
Point Symmetry | C5 |
Map-Model Fitting and Refinement | |||||
---|---|---|---|---|---|
Id | 1 | ||||
Refinement Space | |||||
Refinement Protocol | |||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details |
Data Acquisition | |||||||||
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Detector Type | FEI FALCON IV (4k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 71 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | FEI TITAN KRIOS |
Minimum Defocus (nm) | 600 |
Maximum Defocus (nm) | 1400 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | 2.7 |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | FEI TITAN KRIOS AUTOGRID HOLDER |
Nominal Magnification | |
Calibrated Magnification | |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details |
EM Software | ||
---|---|---|
Task | Software Package | Version |
PARTICLE SELECTION | cryoSPARC | 4.2.1 |
IMAGE ACQUISITION | EPU | |
CTF CORRECTION | CTFFIND | 4.1 |
MODEL FITTING | Coot | 0.9.8.7 |
MODEL REFINEMENT | PHENIX | 1.21 |
INITIAL EULER ASSIGNMENT | RELION | 4.0.1 |
FINAL EULER ASSIGNMENT | RELION | 4.0.1 |
CLASSIFICATION | RELION | 4.0.1 |
RECONSTRUCTION | RELION | 4.0.1 |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
PHASE FLIPPING AND AMPLITUDE CORRECTION | 641067 |