8I2Z

Cryo-EM structure of the zeaxanthin-bound kin4B8


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg28.529
r_long_range_B_refined17.889
r_long_range_B_other17.884
r_dihedral_angle_4_deg17.128
r_dihedral_angle_3_deg15.096
r_scangle_other14.149
r_scbond_it10.043
r_scbond_other10.038
r_mcangle_other9.63
r_mcangle_it9.626
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg28.529
r_long_range_B_refined17.889
r_long_range_B_other17.884
r_dihedral_angle_4_deg17.128
r_dihedral_angle_3_deg15.096
r_scangle_other14.149
r_scbond_it10.043
r_scbond_other10.038
r_mcangle_other9.63
r_mcangle_it9.626
r_mcbond_it7.852
r_mcbond_other7.837
r_dihedral_angle_1_deg3.973
r_angle_other_deg1.613
r_angle_refined_deg1.332
r_chiral_restr0.084
r_bond_other_d0.031
r_bond_refined_d0.01
r_gen_planes_refined0.008
r_gen_planes_other0.002
r_nbd_refined
r_nbd_other
r_nbtor_refined
r_nbtor_other
r_xyhbond_nbd_refined
r_xyhbond_nbd_other
r_metal_ion_refined
r_metal_ion_other
r_symmetry_vdw_refined
r_symmetry_vdw_other
r_symmetry_hbond_refined
r_symmetry_hbond_other
r_symmetry_metal_ion_refined
r_symmetry_metal_ion_other
r_scangle_it
r_rigid_bond_restr
r_sphericity_free
r_sphericity_bonded
Sample
Kin4B8
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification Instrument
Cryogen NameETHANE
Sample Vitrification DetailsVitrification carried out in ethane atmosphere.
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles4337540
Reported Resolution (Å)2.3
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Map-Model Fitting and Refinement
Id1
Refinement Space
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K3 (6k x 4k)
Electron Dose (electrons/Å**2)50.14
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelTFS KRIOS
Minimum Defocus (nm)600
Maximum Defocus (nm)1600
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
CTF CORRECTIONRELION3.1
INITIAL EULER ASSIGNMENTcryoSPARC2.0
FINAL EULER ASSIGNMENTcryoSPARC2.0
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION