8FZ7

TpeA bound closed MthK-A88F mutant in nanodisc


ELECTRON MICROSCOPY

Starting Model(s)

Initial Refinement Model(s)
TypeSourceAccession CodeDetails
experimental modelPDB 6U6D 

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d8.024
f_angle_d0.514
f_chiral_restr0.049
f_plane_restr0.007
f_bond_d0.006
Sample
TpeA bound MthK A88F mutant in 0 Ca2+
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification DetailsBLOTTING FOR 2 S (BLOT FORCE 0)
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles105404
Reported Resolution (Å)2.88
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Map-Model Fitting and Refinement
Id1 (6U6D)
Refinement SpaceREAL
Refinement ProtocolAB INITIO MODEL
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å**2)58.9
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)500
Maximum Defocus (nm)3000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
INITIAL EULER ASSIGNMENTRELION4
FINAL EULER ASSIGNMENTRELION4
RECONSTRUCTIONRELION4
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING ONLY