8EHR

Cryo-EM reconstruction of the CFA/I bacterial adhesion pili


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d4.389
f_angle_d0.816
f_chiral_restr0.045
f_plane_restr0.004
f_bond_d0.002
Sample
CFA/I bacterial adhesion pili
Specimen Preparation
Sample Aggregation StateHELICAL ARRAY
Vitrification InstrumentFEI VITROBOT MARK III
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodHELICAL
Number of Particles325069
Reported Resolution (Å)3.2
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypeHELICAL
Axial SymmetryC1
Axial Rise8.505
Angular Rotation113.37
Map-Model Fitting and Refinement
Id1 (6NRV)
Refinement SpaceREAL
Refinement ProtocolOTHER
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K3 (6k x 4k)
Electron Dose (electrons/Å**2)53.7
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)1000
Maximum Defocus (nm)3000
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONRELION3.1.1
IMAGE ACQUISITIONLeginon
CTF CORRECTIONCTFFIND4.0
MODEL FITTINGPHENIX1.18
MODEL FITTINGUCSF Chimera1.14
INITIAL EULER ASSIGNMENTRELION3.1.1
FINAL EULER ASSIGNMENTRELION3.1.1
RECONSTRUCTIONRELION3.1.1
MODEL REFINEMENTPHENIX1.18
MODEL REFINEMENTISOLDE1.4
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION6094726