8DFQ

Ectodomain of full-length KIT(T417I,delta418-419)-SCF dimers


ELECTRON MICROSCOPY

Starting Model(s)

Initial Refinement Model(s)
TypeSourceAccession CodeDetails
experimental modelPDB 8DFM 

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d12.302
f_angle_d1.093
f_chiral_restr0.061
f_plane_restr0.008
f_bond_d0.004
Sample
Full-length KIT(T417I,delta418-419)-SCF dimers reconstituted in amphipol
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentGATAN CRYOPLUNGE 3
Cryogen NameETHANE
Sample Vitrification DetailsBlotting time 3 sec, blotting force 0.
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles337995
Reported Resolution (Å)3.96
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Map-Model Fitting and Refinement
Id1 (8DFM)
Refinement SpaceREAL
Refinement ProtocolRIGID BODY FIT
Refinement Target
Overall B Value145
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K3 (6k x 4k)
Electron Dose (electrons/Å**2)49.31
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)500
Maximum Defocus (nm)1500
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification130000
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARC3.2.0
IMAGE ACQUISITIONEPU
CTF CORRECTIONcryoSPARC3.2.0
MODEL FITTINGISOLDE1.0b3
INITIAL EULER ASSIGNMENTcryoSPARC3.2.0
FINAL EULER ASSIGNMENTcryoSPARC3.2.0
CLASSIFICATIONcryoSPARC3.2.0
RECONSTRUCTIONcryoSPARC3.2.0
MODEL REFINEMENTPHENIX1.02.1-4487-000
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION2650475