7T62
GPC2 HEP CT3 complex
ELECTRON MICROSCOPY
Sample |
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GPC2 HET CT3 complex |
Specimen Preparation | |
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Sample Aggregation State | PARTICLE |
Staining Type | NEGATIVE |
Staining Material | uranyl formate |
Staining Details | A 3 uL aliquot containing ~0.01 mg/mL of the samples was applied for 20 s onto a carbon-coated 200 Cu mesh grid (Electron Microscopy Sciences, Protoch ... |
3D Reconstruction | |
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Reconstruction Method | SINGLE PARTICLE |
Number of Particles | 21000 |
Reported Resolution (Å) | 21 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | |
Refinement Type | |
Symmetry Type | POINT |
Point Symmetry | C1 |
Map-Model Fitting and Refinement | |||||
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Id | 1 | ||||
Refinement Space | |||||
Refinement Protocol | |||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details |
Data Acquisition | |||||||||
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Detector Type | FEI EAGLE (2k x 2k) | ||||||||
Electron Dose (electrons/Å**2) | 40 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | FEI TECNAI 20 |
Minimum Defocus (nm) | 2000 |
Maximum Defocus (nm) | 5000 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | |
Nominal Magnification | 100000 |
Calibrated Magnification | |
Source | LAB6 |
Acceleration Voltage (kV) | 200 |
Imaging Details |
EM Software | ||
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Task | Software Package | Version |
IMAGE ACQUISITION | SerialEM | |
INITIAL EULER ASSIGNMENT | RELION | 3.08 |
FINAL EULER ASSIGNMENT | RELION | 3.08 |
CLASSIFICATION | RELION | 3.08 |
RECONSTRUCTION | RELION | 3.08 |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
NONE | 21000 |