7SXN

Orb2A residues 1-9 MYNKFVNFI

ELECTRON CRYSTALLOGRAPHY

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Crystal Data

Unit Cell
Length ( Å )	Angle ( ˚ )
a = 4.83	α = 90
b = 23.1	β = 92.001
c = 29.84	γ = 90

Symmetry
Space Group	P 1 21 1

Diffraction

Diffraction Experiment
ID #	Crystal ID	Scattering Type	Data Collection Temperature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1	1						2018-10-17

Radiation Source
ID #	Source	Type	Wavelength List	Synchrotron Site	Beamline
1	ELECTRON MICROSCOPE		0.0251

Data Collection

Overall
ID #	Resolution (High)	Resolution (Low)	Percent Possible (Observed)	R Merge I (Observed)	Rrim I (All)	CC (Half)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1	1.05	18.262	83.3	0.156	0.161	0.994	8.24	13.873		2596			12.406

Highest Resolution Shell
ID #	Resolution (High)	Resolution (Low)	Percent Possible (All)	Percent Possible (Observed)	R Merge I (Observed)	Rrim I (All)	CC (Half)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.05	1.08	69.9		0.712	0.776	0.572	1.79	7.196

Refinement

Statistics
Diffraction ID	Structure Solution Method	Cross Validation method	Resolution (High)	Resolution (Low)	Number Reflections (Observed)	Number Reflections (R-Free)	Percent Reflections (Observed)	R-Factor (All)	R-Work	R-Free	Mean Isotropic B
ELECTRON CRYSTALLOGRAPHY		FREE R-VALUE	1.05	18.262	2596	260	83.258	0.183	0.1809	0.201	10.716

Temperature Factor Modeling
Anisotropic B[1][1]	Anisotropic B[1][2]	Anisotropic B[1][3]	Anisotropic B[2][2]	Anisotropic B[2][3]	Anisotropic B[3][3]
0.579		0.131	-0.41		-0.178

RMS Deviations
Key	Refinement Restraint Deviation
r_dihedral_angle_2_deg	47.531
r_dihedral_angle_3_deg	15.062
r_rigid_bond_restr	9.469
r_dihedral_angle_1_deg	6.544
r_lrange_it	3.303
r_lrange_other	3.298
r_scbond_other	3.037
r_scbond_it	3.036
r_mcbond_it	2.543
r_scangle_it	2.536
r_scangle_other	2.518
r_mcangle_it	2.346
r_mcangle_other	2.345
r_mcbond_other	2.104
r_angle_refined_deg	1.843
r_angle_other_deg	0.638
r_symmetry_xyhbond_nbd_refined	0.356
r_xyhbond_nbd_refined	0.254
r_nbd_other	0.234
r_nbtor_refined	0.194
r_symmetry_nbd_other	0.191
r_nbd_refined	0.138
r_chiral_restr	0.108
r_symmetry_nbtor_other	0.079
r_symmetry_nbd_refined	0.051
r_bond_refined_d	0.015
r_gen_planes_refined	0.011
r_bond_other_d	0.003
r_gen_planes_other	0.002

Software

Software
Software Name	Purpose
XDS	data reduction
XSCALE	data scaling
REFMAC	refinement
PDB_EXTRACT	data extraction

Sample
Amyloid fibril of Orb2A residues 1-9 MYNKFVNFI

Specimen Preparation
Sample Aggregation State	3D ARRAY
Vitrification Instrument
Cryogen Name	ETHANE
Sample Vitrification Details

3D Reconstruction
Reconstruction Method	CRYSTALLOGRAPHY
Number of Particles
Reported Resolution (Å)
Resolution Method	DIFFRACTION PATTERN/LAYERLINES
Other Details
Refinement Type
Symmetry Type	3D CRYSTAL
Space Group Name
Length a	4.83
Length b	23.1
Length c	23.1
Angle Alpha	90
Angle Beta	92
Angle Gamma	90

Map-Model Fitting and Refinement
Id	1
Refinement Space	RECIPROCAL
Refinement Protocol
Refinement Target
Overall B Value
Fitting Procedure
Details

Data Acquisition
Detector Type	FEI CETA (4k x 4k)
Electron Dose (electrons/Å**2)	0.01

Imaging Experiment	1
Date of Experiment
Temperature (Kelvin)
Microscope Model	FEI TALOS ARCTICA
Minimum Defocus (nm)
Maximum Defocus (nm)
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging Mode	DIFFRACTION
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
Source	FIELD EMISSION GUN
Acceleration Voltage (kV)	200
Imaging Details

Image Processing
CTF Correction Type	CTF Correction Details	Number of Particles Selected	Particle Selection Details
NONE