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Extended H/L (SLPH/SLPL) complex from C. difficile (CD630 strain) fit into R20291 S-layer negative stain map
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 321 α = 90 b = 261 β = 90 c = 345.312 γ = 90
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Number Reflections (R-Free) Percent Reflections (Observed) R-Work (Depositor) R-Free (Depositor) Mean Isotropic B ELECTRON CRYSTALLOGRAPHY THROUGHOUT 57.857
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3]
Sample Electron crystallographic reconstruction of R20291 S-layer, extended to cover 12 molecules of SlpA for flexible fitting of X-ray structure to map
Specimen Preparation Sample Aggregation State 2D ARRAY Staining Type NEGATIVE Staining Material Uranyl Formate Staining Details Negatively stained EM samples were prepared by depositing sample on continuous carbon layer and staining with 2 % Uranyl Formate with blotting
3D Reconstruction Reconstruction Method CRYSTALLOGRAPHY Number of Particles Reported Resolution (Å) Resolution Method DIFFRACTION PATTERN/LAYERLINES Other Details Refinement Type Symmetry Type 3D CRYSTAL Space Group Name Length a 80 Length b 80 Length c 80 Angle Alpha 100 Angle Beta 90 Angle Gamma 100
Map-Model Fitting and Refinement Id 1 Refinement Space REAL Refinement Protocol FLEXIBLE FIT Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type GATAN ULTRASCAN 4000 (4k x 4k) Electron Dose (electrons/Å**2) 0.1
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model FEI/PHILIPS CM200FEG Minimum Defocus (nm) 800 Maximum Defocus (nm) 2200 Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode BRIGHT FIELD Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 200 Imaging Details
EM Software Task Software Package Version CTF CORRECTION CTFFIND 3 MODEL FITTING ISOLDE 1.1.0 LATTICE DISTORTION CORRECTION MRC IMAGE PROCESSING PACKAGE SYMMETRY DETERMINATION MRC IMAGE PROCESSING PACKAGE CRYSTALLOGRAPHY MERGING MRC IMAGE PROCESSING PACKAGE
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING AND AMPLITUDE CORRECTION