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HEWL in cesium chloride (1.71 M CsCl in cryo protectant)
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 VAPOR DIFFUSION, HANGING DROP 4.5 293.15 50 mM sodium acetate pH 4.5, 1.71 M sodium chloride
Crystal Properties Matthews coefficient Solvent content 1.99 38.23
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 78.753 α = 90 b = 78.753 β = 90 c = 36.812 γ = 90
Symmetry Space Group P 43 21 2
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 x-ray 100 PIXEL DECTRIS PILATUS 6M-F 2016-12-01 M SINGLE WAVELENGTH
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 SYNCHROTRON PETRA III, EMBL c/o DESY BEAMLINE P14 (MX2) 1.7712 PETRA III, EMBL c/o DESY P14 (MX2)
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) Rrim I (All) Rpim I (All) CC (Half) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 1.79 39.38 98.7 0.104 0.106 0.023 0.999 24.9 19.5 11383
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) Rrim I (All) Rpim I (All) CC (Half) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1 1.79 1.82 78.6 0.452 0.478 0.147 0.881 8.7
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Work (DCC) R-Free (Depositor) R-Free (DCC) R-Free Selection Details Mean Isotropic B X-RAY DIFFRACTION SAD THROUGHOUT 1.79 39.38 10537 530 96.27 0.2115 0.2091 0.2154 0.257 0.271 RANDOM 18.518
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] 0.01 0.01 -0.02
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 34.565 r_dihedral_angle_4_deg 24.856 r_dihedral_angle_3_deg 14.053 r_dihedral_angle_1_deg 6.244 r_angle_refined_deg 1.784 r_angle_other_deg 1.177 r_chiral_restr 0.125 r_bond_refined_d 0.018 r_gen_planes_refined 0.01 r_bond_other_d 0.002
Show All KeysRMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 34.565 r_dihedral_angle_4_deg 24.856 r_dihedral_angle_3_deg 14.053 r_dihedral_angle_1_deg 6.244 r_angle_refined_deg 1.784 r_angle_other_deg 1.177 r_chiral_restr 0.125 r_bond_refined_d 0.018 r_gen_planes_refined 0.01 r_bond_other_d 0.002 r_gen_planes_other 0.002
Hide All KeysNon-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 1001 Nucleic Acid Atoms Solvent Atoms 127 Heterogen Atoms 22
Software Software Software Name Purpose XDS data scaling REFMAC refinement PDB_EXTRACT data extraction PHASER phasing XDS data reduction