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STRUCTURE OF HEWL BY ELECTRON DIFFRACTION AND MICROFOCUS DIFFRACTION
Starting Model(s) Initial Refinement Model(s) Type Source Accession Code Details experimental model PDB 1B2K
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 1.5 M SODIUM CHLORIDE
Crystal Properties Matthews coefficient Solvent content 2.07 40.5
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 31.849 α = 90 b = 54.38 β = 98.82 c = 71.788 γ = 90
Symmetry Space Group P 1 21 1
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 electron 100 OTHER ASI 2018-10-01 M SINGLE WAVELENGTH
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 LaB6 THERMOIONIC SOURCE
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 2.8 42.67 66.5 0.655 1.6 2.8 3906
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1 2.8 2.97 67.1 0.839 0.8 2.8
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Cut-off Sigma (F) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Free (Depositor) R-Free (DCC) R-Free Selection Details Mean Isotropic B ELECTRON CRYSTALLOGRAPHY NONE 2.8 42.67 1.34 3840 177 63.05 0.2995 0.2975 0.339 0.2997 RANDOM
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3]
RMS Deviations Key Refinement Restraint Deviation f_dihedral_angle_d 13.18 f_angle_d 0.776 f_chiral_restr 0.047 f_bond_d 0.004 f_plane_restr 0.004
Non-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 1980 Nucleic Acid Atoms Solvent Atoms Heterogen Atoms 3
Software Software Software Name Purpose XDS data reduction Aimless data scaling XDS phasing CCP4 phasing PHENIX refinement
Specimen Preparation Sample Aggregation State 3D ARRAY Vitrification Instrument Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method CRYSTALLOGRAPHY Number of Particles Reported Resolution (Å) 2.8 Resolution Method DIFFRACTION PATTERN/LAYERLINES Other Details Refinement Type Symmetry Type 3D CRYSTAL Space Group Name Length a 31.849 Length b 54.38 Length c 54.38 Angle Alpha 90 Angle Beta 98.82 Angle Gamma 90
Map-Model Fitting and Refinement Id 1 (1B2K) Refinement Space Refinement Protocol OTHER Refinement Target CORRELATION COEF Overall B Value 10.8 Fitting Procedure Details
Data Acquisition Detector Type OTHER Electron Dose (electrons/Å**2) 9
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model ZEISS LIBRA120PLUS Minimum Defocus (nm) Maximum Defocus (nm) Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode DARK FIELD Specimen Holder Model Nominal Magnification Calibrated Magnification Source LAB6 Acceleration Voltage (kV) 120 Imaging Details
EM Software Task Software Package Version MODEL FITTING PHENIX 1.13 MOLECULAR REPLACEMENT PHENIX 1.13 MODEL REFINEMENT PHENIX 1.13
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details NONE