6HU5

STRUCTURE OF HEWL BY ELECTRON DIFFRACTION AND MICROFOCUS DIFFRACTION


ELECTRON CRYSTALLOGRAPHY

Crystallization

Crystalization Experiments
IDMethodpHTemperatureDetails
11.5 M SODIUM CHLORIDE
Crystal Properties
Matthews coefficientSolvent content
2.0740.5

Crystal Data

Unit Cell
Length ( Å )Angle ( ˚ )
a = 31.849α = 90
b = 54.38β = 98.82
c = 71.788γ = 90
Symmetry
Space GroupP 1 21 1

Diffraction

Diffraction Experiment
ID #Crystal IDScattering TypeData Collection TemperatureDetectorDetector TypeDetailsCollection DateMonochromatorProtocol
11electron100OTHERASI2018-10-01MSINGLE WAVELENGTH
Radiation Source
ID #SourceTypeWavelength ListSynchrotron SiteBeamline
1LaB6 THERMOIONIC SOURCE

Data Collection

Overall
ID #Resolution (High)Resolution (Low)Percent Possible (Observed)R Merge I (Observed)Net I Over Average Sigma (I)RedundancyNumber Reflections (All)Number Reflections (Observed)Observed Criterion Sigma (F)Observed Criterion Sigma (I)B (Isotropic) From Wilson Plot
12.842.6766.50.6551.62.83906
Highest Resolution Shell
ID #Resolution (High)Resolution (Low)Percent Possible (All)Percent Possible (Observed)R Merge I (Observed)Mean I Over Sigma (Observed)RedundancyNumber Unique Reflections (All)
12.82.9767.10.8390.82.8

Refinement

Statistics
Diffraction IDStructure Solution MethodCross Validation methodResolution (High)Resolution (Low)Cut-off Sigma (F)Number Reflections (Observed)Number Reflections (R-Free)Percent Reflections (Observed)R-Factor (Observed)R-WorkR-FreeR-Free Selection DetailsMean Isotropic B
ELECTRON CRYSTALLOGRAPHYNONE2.842.671.34384017763.050.29950.29750.339RANDOM
Temperature Factor Modeling
Anisotropic B[1][1]Anisotropic B[1][2]Anisotropic B[1][3]Anisotropic B[2][2]Anisotropic B[2][3]Anisotropic B[3][3]
RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d13.18
f_angle_d0.776
f_chiral_restr0.047
f_bond_d0.004
f_plane_restr0.004
Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen AtomsNumber
Protein Atoms1980
Nucleic Acid Atoms
Solvent Atoms
Heterogen Atoms3

Software

Software
Software NamePurpose
XDSdata reduction
Aimlessdata scaling
XDSphasing
CCP4phasing
PHENIXrefinement
Sample
HWEL
Specimen Preparation
Sample Aggregation State3D ARRAY
Vitrification Instrument
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodCRYSTALLOGRAPHY
Number of Particles
Reported Resolution (Å)2.8
Resolution MethodDIFFRACTION PATTERN/LAYERLINES
Other Details
Refinement Type
Symmetry Type3D CRYSTAL
Space Group Name
Length a31.849
Length b54.38
Length c54.38
Angle Alpha90
Angle Beta98.82
Angle Gamma90
Map-Model Fitting and Refinement
Id1 (1B2K)
Refinement Space
Refinement ProtocolOTHER
Refinement TargetCORRELATION COEF
Overall B Value10.8
Fitting Procedure
Details
Data Acquisition
Detector TypeOTHER
Electron Dose (electrons/Å**2)9
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelZEISS LIBRA120PLUS
Minimum Defocus (nm)
Maximum Defocus (nm)
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeDARK FIELD
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceLAB6
Acceleration Voltage (kV)120
Imaging Details
EM Software
TaskSoftware PackageVersion
MODEL FITTINGPHENIX1.13
MOLECULAR REPLACEMENTPHENIX1.13
MODEL REFINEMENTPHENIX1.13
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
NONE