6UWM

Single particle cryo-EM structure of KvAP


ELECTRON MICROSCOPY
Sample
KvAP-6E1 Fab complex
Sample Components
KvAP
6E1 Fab
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification InstrumentFEI VITROBOT MARK IV
Cryogen NameETHANE
Sample Vitrification DetailsBlot for 4 seconds before plunging.
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles67000
Reported Resolution (Å)5.9
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Point SymmetryC4
Map-Model Fitting and Refinement
Id1 (1ORS, 1ORQ)
Refinement SpaceREAL
Refinement ProtocolRIGID BODY FIT
Refinement Target
Overall B Value
Fitting Procedure
Details
Data Acquisition
Detector TypeGATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å**2)75
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)800
Maximum Defocus (nm)2200
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder ModelFEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification29000
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONGautomatchv0.56_sm61_cu8.0
IMAGE ACQUISITIONSerialEM
CTF CORRECTIONGctf1.06
MODEL FITTINGUCSF Chimera1.13.1
MODEL FITTINGCoot0.8.9.2
MODEL REFINEMENTPHENIX1.16
INITIAL EULER ASSIGNMENTcryoSPARC2.9.0
FINAL EULER ASSIGNMENTFREALIGN9.11
CLASSIFICATIONRELION3.0.8
RECONSTRUCTIONFREALIGN9.11
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
NONE1800000