6TY3
FAK structure from single particle analysis of 2D crystals
ELECTRON MICROSCOPY
Sample |
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Focal adhesion kinase |
Specimen Preparation | |
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Sample Aggregation State | 2D ARRAY |
Vitrification Instrument | |
Cryogen Name | ETHANE |
Sample Vitrification Details |
3D Reconstruction | |
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Reconstruction Method | SINGLE PARTICLE |
Number of Particles | 106785 |
Reported Resolution (Å) | 6.32 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | |
Refinement Type | |
Symmetry Type | POINT |
Point Symmetry | C2 |
Map-Model Fitting and Refinement | |||||
---|---|---|---|---|---|
Id | 1 (2AEH, 1MP8) | ||||
Refinement Space | REAL | ||||
Refinement Protocol | FLEXIBLE FIT | ||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details |
Data Acquisition | |||||||||
---|---|---|---|---|---|---|---|---|---|
Detector Type | GATAN K2 SUMMIT (4k x 4k) | GATAN K2 SUMMIT (4k x 4k) | |||||||
Electron Dose (electrons/Å**2) | 40 | 40 |
Imaging Experiment | 1 | 2 |
---|---|---|
Date of Experiment | ||
Temperature (Kelvin) | ||
Microscope Model | FEI TITAN KRIOS | FEI POLARA 300 |
Minimum Defocus (nm) | ||
Maximum Defocus (nm) | ||
Minimum Tilt Angle (degrees) | ||
Maximum Tilt Angle (degrees) | ||
Nominal CS | 2.7 | 2.26 |
Imaging Mode | BRIGHT FIELD | BRIGHT FIELD |
Specimen Holder Model | ||
Nominal Magnification | ||
Calibrated Magnification | ||
Source | FIELD EMISSION GUN | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 | 300 |
Imaging Details |
EM Software | ||
---|---|---|
Task | Software Package | Version |
IMAGE ACQUISITION | SerialEM | |
MODEL FITTING | iMODFIT | |
RECONSTRUCTION | cryoSPARC | |
MODEL REFINEMENT | PHENIX | |
IMAGE ACQUISITION | SerialEM | |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
PHASE FLIPPING AND AMPLITUDE CORRECTION |