6TGP
Cryo-EM structure of AtNBR1-PB1 filament (S-type)
ELECTRON MICROSCOPY
Refinement
RMS Deviations | |
---|---|
Key | Refinement Restraint Deviation |
r_mcangle_it | 69.718 |
r_scbond_it | 61.513 |
r_mcbond_it | 41.204 |
r_dihedral_angle_2_deg | 25.753 |
r_dihedral_angle_4_deg | 17.463 |
r_dihedral_angle_3_deg | 15.434 |
r_dihedral_angle_1_deg | 7.813 |
r_angle_refined_deg | 1.667 |
r_chiral_restr | 0.109 |
r_bond_refined_d | 0.012 |
Sample |
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AtNBR1-PB1 (S-type) |
Specimen Preparation | |
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Sample Aggregation State | FILAMENT |
Vitrification Instrument | LEICA EM GP |
Cryogen Name | ETHANE |
Sample Vitrification Details |
3D Reconstruction | |
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Reconstruction Method | HELICAL |
Number of Particles | 18021 |
Reported Resolution (Å) | 4.4 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | |
Refinement Type | |
Symmetry Type | HELICAL |
Axial Symmetry | C1 |
Axial Rise | 5.905 |
Angular Rotation | -31.17 |
Map-Model Fitting and Refinement | |||||
---|---|---|---|---|---|
Id | 1 | ||||
Refinement Space | REAL | ||||
Refinement Protocol | FLEXIBLE FIT | ||||
Refinement Target | Correlation coefficient | ||||
Overall B Value | |||||
Fitting Procedure | |||||
Details |
Data Acquisition | |||||||||
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Detector Type | FEI FALCON II (4k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 14 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | FEI TITAN KRIOS |
Minimum Defocus (nm) | 500 |
Maximum Defocus (nm) | 4500 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | 2.7 |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | FEI TITAN KRIOS AUTOGRID HOLDER |
Nominal Magnification | 59000 |
Calibrated Magnification | |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details |
EM Software | ||
---|---|---|
Task | Software Package | Version |
PARTICLE SELECTION | SPRING | 0.85 |
IMAGE ACQUISITION | SerialEM | |
CTF CORRECTION | CTFFIND | 4 |
MODEL FITTING | PHENIX | dev-3500 |
MODEL REFINEMENT | PHENIX | dev-3500 |
INITIAL EULER ASSIGNMENT | SPRING | 0.85 |
FINAL EULER ASSIGNMENT | SPRING | 0.85 |
CLASSIFICATION | SPRING | 0.85 |
RECONSTRUCTION | SPRING | 0.85 |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
PHASE FLIPPING AND AMPLITUDE CORRECTION |