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ECAII(T89V,K162T) MUTANT IN COMPLEX WITH L-ASN AT PH 8.3 in space group C2
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 VAPOR DIFFUSION, HANGING DROP 8.3 298 Crystals grown from 0.17 M NH4-citrate, pH 7.0, 17-18% PEG3350 and then soaked for 1 min in 0.1 M Tris, pH 8.3, 19-20% PEG3350 with 5 mM L-Asn
Crystal Properties Matthews coefficient Solvent content 2.06 40.35
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 151.22 α = 90 b = 62.397 β = 117.71 c = 140.875 γ = 90
Symmetry Space Group C 1 2 1
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 x-ray 100 PIXEL DECTRIS EIGER R 4M Multilayer X-ray mirrors VariMax HF 2018-08-15 M SINGLE WAVELENGTH
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) Rrim I (All) Rpim I (All) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 2.12 40 98.4 0.071 0.086 0.047 8.1 3.1 65535
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) Rrim I (All) Rpim I (All) CC (Half) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1 2.12 2.16 93.7 0.425 0.511 0.281 0.816 3.1
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Work (DCC) R-Free (Depositor) R-Free (DCC) R-Free Selection Details Mean Isotropic B X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.12 40 63323 1977 98.4 0.1652 0.1631 0.1715 0.2309 0.2344 RANDOM 29.636
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] 0.31 -0.83 0.33
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 42.689 r_dihedral_angle_4_deg 16.316 r_dihedral_angle_3_deg 15.111 r_dihedral_angle_1_deg 6.88 r_angle_refined_deg 1.932 r_angle_other_deg 1.101 r_chiral_restr 0.116 r_bond_refined_d 0.02 r_gen_planes_refined 0.01 r_bond_other_d 0.002
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 42.689 r_dihedral_angle_4_deg 16.316 r_dihedral_angle_3_deg 15.111 r_dihedral_angle_1_deg 6.88 r_angle_refined_deg 1.932 r_angle_other_deg 1.101 r_chiral_restr 0.116 r_bond_refined_d 0.02 r_gen_planes_refined 0.01 r_bond_other_d 0.002 r_gen_planes_other 0.002
Non-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 9537 Nucleic Acid Atoms Solvent Atoms 875 Heterogen Atoms 51
Software Software Software Name Purpose HKL-2000 data reduction HKL-2000 data scaling PHASER phasing REFMAC refinement PDB_EXTRACT data extraction