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STGGYG from low-complexity domain of FUS, residues 77-82
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 VAPOR DIFFUSION, HANGING DROP 4.6 298 0.1 M sodium acetate, pH 4.6, 0.15 M ammonium sulfate, 25% w/v PEG2000 MME
Crystal Properties Matthews coefficient Solvent content 1.6 23.22
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 13.79 α = 90 b = 4.93 β = 90 c = 101.9 γ = 90
Symmetry Space Group P 21 21 21
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 100 CMOS TVIPS F416 CMOS CAMERA 2015-08-18
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 ELECTRON MICROSCOPE TECNAI F20 TEM 0.0251
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) Rrim I (All) CC (Half) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 1.1 13.31 95.5 0.25 0.266 0.985 4.15 7.227 3220 6.25
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) Rrim I (All) CC (Half) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1 1.1 1.13 74.9 0.553 0.629 0.729 1.46 3.939
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Work (DCC) R-Free (Depositor) R-Free (DCC) R-Free Selection Details Mean Isotropic B ELECTRON CRYSTALLOGRAPHY AB INITIO PHASING THROUGHOUT 1.1 13.31 3218 322 95.6 0.223 0.219 0.2876 0.255 0.3381 RANDOM 8.09
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] 0.9157 -0.1121 -0.8036
RMS Deviations Key Refinement Restraint Deviation t_other_torsion 8.81 t_omega_torsion 3.42 t_angle_deg 1.06 t_bond_d 0.013 t_dihedral_angle_d t_trig_c_planes t_gen_planes t_it t_nbd t_improper_torsion
RMS Deviations Key Refinement Restraint Deviation t_other_torsion 8.81 t_omega_torsion 3.42 t_angle_deg 1.06 t_bond_d 0.013 t_dihedral_angle_d t_trig_c_planes t_gen_planes t_it t_nbd t_improper_torsion t_pseud_angle t_chiral_improper_torsion t_sum_occupancies t_utility_distance t_utility_angle t_utility_torsion t_ideal_dist_contact
Non-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 76 Nucleic Acid Atoms Solvent Atoms 3 Heterogen Atoms 11
Software Software Software Name Purpose XSCALE data scaling BUSTER refinement PDB_EXTRACT data extraction
Sample A fibril composed of a 6-residue segment of FUS
Specimen Preparation Sample Aggregation State 3D ARRAY Vitrification Instrument FEI VITROBOT MARK IV Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method CRYSTALLOGRAPHY Number of Particles Reported Resolution (Å) 1.1 Resolution Method DIFFRACTION PATTERN/LAYERLINES Other Details Density map was obtained using measured diffration intensities and phases acquired from a crystallographic direct methods program, SHELXD. Refinement Type Symmetry Type 3D CRYSTAL Space Group Name Length a 13.79 Length b 4.93 Length c 4.93 Angle Alpha 90 Angle Beta 90 Angle Gamma 90
Map-Model Fitting and Refinement Id 1 Refinement Space RECIPROCAL Refinement Protocol OTHER Refinement Target maximum liklihood Overall B Value 8.09 Fitting Procedure Details
Data Acquisition Detector Type TVIPS TEMCAM-F416 (4k x 4k) Electron Dose (electrons/Å**2) 0.01
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model FEI TECNAI F20 Minimum Defocus (nm) Maximum Defocus (nm) Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode DIFFRACTION Specimen Holder Model GATAN 626 SINGLE TILT LIQUID NITROGEN CRYO TRANSFER HOLDER Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 200 Imaging Details
EM Software Task Software Package Version IMAGE ACQUISITION EM-Menu MODEL FITTING Coot 0.8.2 RECONSTRUCTION SHELXD 2013/2 MODEL REFINEMENT BUSTER 2.10.3
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details NONE