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Cryo-EM structure of the ATP-bound Vps4 mutant-E233Q complex with Vta1 (masked)
Refinement RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 33.778 r_long_range_B_refined 19.215 r_long_range_B_other 19.215 r_dihedral_angle_3_deg 13.612 r_dihedral_angle_4_deg 13.381 r_dihedral_angle_1_deg 6.679 r_mcangle_it 5.991 r_mcangle_other 5.99 r_scangle_other 4.135 r_mcbond_it 3.205
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 33.778 r_long_range_B_refined 19.215 r_long_range_B_other 19.215 r_dihedral_angle_3_deg 13.612 r_dihedral_angle_4_deg 13.381 r_dihedral_angle_1_deg 6.679 r_mcangle_it 5.991 r_mcangle_other 5.99 r_scangle_other 4.135 r_mcbond_it 3.205 r_mcbond_other 3.205 r_scbond_it 2.042 r_scbond_other 2.042 r_angle_refined_deg 1.453 r_angle_other_deg 1.004 r_chiral_restr 0.091 r_bond_refined_d 0.009 r_gen_planes_refined 0.006 r_bond_other_d 0.002 r_gen_planes_other 0.002 r_nbd_refined r_nbd_other r_nbtor_refined r_nbtor_other r_xyhbond_nbd_refined r_xyhbond_nbd_other r_metal_ion_refined r_metal_ion_other r_symmetry_vdw_refined r_symmetry_vdw_other r_symmetry_hbond_refined r_symmetry_hbond_other r_symmetry_metal_ion_refined r_symmetry_metal_ion_other r_scangle_it r_rigid_bond_restr r_sphericity_free r_sphericity_bonded
Sample Vps4-E233Q hexamer complexed with VTA1
Specimen Preparation Sample Aggregation State PARTICLE Vitrification Instrument Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method SINGLE PARTICLE Number of Particles 106106 Reported Resolution (Å) 4.18 Resolution Method FSC 0.143 CUT-OFF Other Details Refinement Type Symmetry Type POINT
Data Acquisition Detector Type GATAN K2 SUMMIT (4k x 4k) Electron Dose (electrons/Å**2) 50
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model FEI TITAN KRIOS Minimum Defocus (nm) Maximum Defocus (nm) Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode BRIGHT FIELD Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 300 Imaging Details
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING AND AMPLITUDE CORRECTION