5XMI

Cryo-EM Structure of the ATP-bound VPS4 mutant-E233Q hexamer (masked)


ELECTRON MICROSCOPY

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg31.44
r_dihedral_angle_3_deg12.231
r_dihedral_angle_4_deg10.926
r_long_range_B_refined8.816
r_long_range_B_other8.816
r_dihedral_angle_1_deg6.371
r_mcangle_it2.552
r_mcangle_other2.552
r_mcbond_it1.33
r_mcbond_other1.33
RMS Deviations
KeyRefinement Restraint Deviation
r_dihedral_angle_2_deg31.44
r_dihedral_angle_3_deg12.231
r_dihedral_angle_4_deg10.926
r_long_range_B_refined8.816
r_long_range_B_other8.816
r_dihedral_angle_1_deg6.371
r_mcangle_it2.552
r_mcangle_other2.552
r_mcbond_it1.33
r_mcbond_other1.33
r_angle_refined_deg1.166
r_scangle_other1.106
r_angle_other_deg0.891
r_scbond_it0.411
r_scbond_other0.41
r_chiral_restr0.068
r_bond_refined_d0.008
r_gen_planes_refined0.006
r_bond_other_d0.001
r_gen_planes_other0.001
r_nbd_refined
r_nbd_other
r_nbtor_refined
r_nbtor_other
r_xyhbond_nbd_refined
r_xyhbond_nbd_other
r_metal_ion_refined
r_metal_ion_other
r_symmetry_vdw_refined
r_symmetry_vdw_other
r_symmetry_hbond_refined
r_symmetry_hbond_other
r_symmetry_metal_ion_refined
r_symmetry_metal_ion_other
r_scangle_it
r_rigid_bond_restr
r_sphericity_free
r_sphericity_bonded
Sample
Vps4-E233Q hexamer
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification Instrument
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles106918
Reported Resolution (Å)3.9
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Data Acquisition
Detector TypeGATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å**2)50
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)
Maximum Defocus (nm)
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION