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Cryo-EM structure of P. aeruginosa flagellar filaments G420A
Refinement RMS Deviations Key Refinement Restraint Deviation f_dihedral_angle_d 6.968 f_angle_d 1.357 f_chiral_restr 0.055 f_bond_d 0.01 f_plane_restr 0.006
Sample Pseudomonas aeruginosa flagella filament
Specimen Preparation Sample Aggregation State FILAMENT Vitrification Instrument Cryogen Name ETHANE Sample Vitrification Details Staining Type NEGATIVE Staining Material negative stain Staining Details
3D Reconstruction Reconstruction Method HELICAL Number of Particles 17450 Reported Resolution (Å) 4.3 Resolution Method OTHER Other Details model-map FSC 0.38 cut-off Refinement Type Symmetry Type HELICAL Axial Symmetry C1 Axial Rise 4.73 Angular Rotation 65.27
Map-Model Fitting and Refinement Id 1 Refinement Space REAL Refinement Protocol Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type FEI FALCON II (4k x 4k) Electron Dose (electrons/Å**2) 20
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model FEI TITAN KRIOS Minimum Defocus (nm) Maximum Defocus (nm) Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode BRIGHT FIELD Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 300 Imaging Details
EM Software Task Software Package Version PARTICLE SELECTION EMAN2 IMAGE ACQUISITION EPU CTF CORRECTION CTFFIND3 MODEL FITTING Rosetta INITIAL EULER ASSIGNMENT SPIDER FINAL EULER ASSIGNMENT SPIDER CLASSIFICATION SPIDER RECONSTRUCTION SPIDER MODEL REFINEMENT PHENIX MODEL REFINEMENT Coot
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING AND AMPLITUDE CORRECTION