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MicroED structure of the segment, DLIIKGISVHI, from the RRM2 of TDP-43, residues 247-257
Starting Model(s) Initial Refinement Model(s) Type Source Accession Code Details in silico model Other idealized 11-residue beta strand
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 BATCH 8.5 310 50 mM CHES, pH 8.5
Crystal Properties Matthews coefficient Solvent content 1.51 18.73
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 24.81 α = 80.88 b = 4.73 β = 86.37 c = 15.83 γ = 89.78
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 100 CMOS TVIPS F416 CMOS CAMERA 2017-01-19
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 ELECTRON MICROSCOPE TECNAI F20 TEM 0.0251
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) Rrim I (All) CC (Half) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 1.4 15.6 73.4 0.203 0.213 0.992 3.34 9.019 1037 -3 21.481
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) Rrim I (All) CC (Half) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1 1.4 1.48 62.1 1.451 1.562 0.333 0.92 6.712
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Starting model Resolution (High) Resolution (Low) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Free (Depositor) R-Free Selection Details Mean Isotropic B ELECTRON CRYSTALLOGRAPHY MOLECULAR REPLACEMENT THROUGHOUT idealized 11-residue beta strand 1.4 15.6 944 92 72.04 0.2655 0.2619 0.3065 RANDOM 33.756
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] 20.78 -1.04 -18.05 -25.77 -3.48 4.98
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 23.273 r_dihedral_angle_3_deg 7.47 r_dihedral_angle_1_deg 6.438 r_angle_refined_deg 1.211 r_angle_other_deg 0.776 r_chiral_restr 0.079 r_bond_other_d 0.017 r_bond_refined_d 0.009 r_gen_planes_refined 0.004 r_gen_planes_other
Non-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 84 Nucleic Acid Atoms Solvent Atoms Heterogen Atoms
Software Software Software Name Purpose XSCALE data scaling PHASER phasing REFMAC refinement PDB_EXTRACT data extraction XDS data reduction
Specimen Preparation Sample Aggregation State 3D ARRAY Vitrification Instrument Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method CRYSTALLOGRAPHY Number of Particles Reported Resolution (Å) Resolution Method DIFFRACTION PATTERN/LAYERLINES Other Details Refinement Type Symmetry Type 3D CRYSTAL Space Group Name Length a 24.81 Length b 4.73 Length c 4.73 Angle Alpha 89.78 Angle Beta 86.37 Angle Gamma 89.78
Map-Model Fitting and Refinement Id 1 Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type TVIPS TEMCAM-F416 (4k x 4k) Electron Dose (electrons/Å**2) 3.4
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model FEI TECNAI 20 Minimum Defocus (nm) Maximum Defocus (nm) Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode DIFFRACTION Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 200 Imaging Details
EM Software Task Software Package Version IMAGE ACQUISITION TVIPS F416 MODEL FITTING Coot MOLECULAR REPLACEMENT Phaser CRYSTALLOGRAPHY MERGING XSCALE MODEL REFINEMENT REFMAC
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details NONE