5THR
Cryo-EM structure of a BG505 Env-sCD4-17b-8ANC195 complex
ELECTRON MICROSCOPY
Refinement
RMS Deviations | |
---|---|
Key | Refinement Restraint Deviation |
r_long_range_B_refined | 57.509 |
r_dihedral_angle_2_deg | 36.335 |
r_mcangle_it | 24.378 |
r_dihedral_angle_3_deg | 20.397 |
r_dihedral_angle_4_deg | 15.231 |
r_mcbond_it | 13.648 |
r_scbond_it | 11.004 |
r_dihedral_angle_1_deg | 7.842 |
r_angle_refined_deg | 1.659 |
r_chiral_restr | 0.104 |
Sample |
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BG505 SOSIP-sCD4-17b-8ANC195 complex |
Sample Components |
CD4 D1-D2 domain |
17b Fab |
BG505 SOSIP trimer |
8ANC195 G52K5 Fab |
Specimen Preparation | |
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Sample Aggregation State | PARTICLE |
Vitrification Instrument | |
Cryogen Name | ETHANE-PROPANE |
Sample Vitrification Details |
3D Reconstruction | |
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Reconstruction Method | SINGLE PARTICLE |
Number of Particles | 5175 |
Reported Resolution (Å) | 8.9 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | |
Refinement Type | |
Symmetry Type | POINT |
Point Symmetry | C3 |
Map-Model Fitting and Refinement | |||||
---|---|---|---|---|---|
Id | 1 | ||||
Refinement Space | |||||
Refinement Protocol | RIGID BODY FIT | ||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details | phenix_real.space.refine |
Data Acquisition | |||||||||
---|---|---|---|---|---|---|---|---|---|
Detector Type | GATAN K2 SUMMIT (4k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 35 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | FEI TITAN KRIOS |
Minimum Defocus (nm) | |
Maximum Defocus (nm) | |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | 2.7 |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | |
Nominal Magnification | |
Calibrated Magnification | |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details |
EM Software | ||
---|---|---|
Task | Software Package | Version |
PARTICLE SELECTION | EMAN2 | |
IMAGE ACQUISITION | SerialEM | |
CTF CORRECTION | CTFFIND4 | |
MODEL FITTING | UCSF Chimera | |
INITIAL EULER ASSIGNMENT | RELION | |
FINAL EULER ASSIGNMENT | RELION | |
CLASSIFICATION | RELION | |
RECONSTRUCTION | RELION | |
MODEL REFINEMENT | PHENIX |
Image Processing | ||||
---|---|---|---|---|
CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
PHASE FLIPPING AND AMPLITUDE CORRECTION |