☰ Navigation Tabs
cryoEM structure of crenactin double helical filament at 3.8A resolution
Refinement RMS Deviations Key Refinement Restraint Deviation r_long_range_B_refined 59.314 r_long_range_B_other 59.314 r_scangle_other 52.501 r_scbond_it 32.212 r_scbond_other 32.211 r_mcangle_it 25.741 r_mcangle_other 25.74 r_dihedral_angle_2_deg 22.324 r_mcbond_it 16.971 r_mcbond_other 16.962
Show All KeysRMS Deviations Key Refinement Restraint Deviation r_long_range_B_refined 59.314 r_long_range_B_other 59.314 r_scangle_other 52.501 r_scbond_it 32.212 r_scbond_other 32.211 r_mcangle_it 25.741 r_mcangle_other 25.74 r_dihedral_angle_2_deg 22.324 r_mcbond_it 16.971 r_mcbond_other 16.962 r_dihedral_angle_3_deg 9.214 r_dihedral_angle_4_deg 8.729 r_dihedral_angle_1_deg 6.921 r_angle_refined_deg 1.453 r_angle_other_deg 1.069 r_chiral_restr 0.083 r_bond_refined_d 0.016 r_gen_planes_refined 0.007 r_bond_other_d 0.004 r_gen_planes_other 0.003 r_nbd_refined r_nbd_other r_nbtor_refined r_nbtor_other r_xyhbond_nbd_refined r_xyhbond_nbd_other r_metal_ion_refined r_metal_ion_other r_symmetry_vdw_refined r_symmetry_vdw_other r_symmetry_hbond_refined r_symmetry_hbond_other r_symmetry_metal_ion_refined r_symmetry_metal_ion_other r_scangle_it r_rigid_bond_restr r_sphericity_free r_sphericity_bonded
Hide All Keys
Sample crenactin double helical filaments
Specimen Preparation Sample Aggregation State HELICAL ARRAY Vitrification Instrument FEI VITROBOT MARK IV Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method HELICAL Number of Particles 470396 Reported Resolution (Å) 3.8 Resolution Method FSC 0.143 CUT-OFF Other Details Refinement Type Symmetry Type HELICAL Axial Symmetry C1 Axial Rise 25.6 Angular Rotation -161.9
Map-Model Fitting and Refinement Id 1 Refinement Space RECIPROCAL Refinement Protocol OTHER Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type FEI FALCON II (4k x 4k) Electron Dose (electrons/Å**2) 40
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model FEI POLARA 300 Minimum Defocus (nm) Maximum Defocus (nm) Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode BRIGHT FIELD Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 300 Imaging Details
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING AND AMPLITUDE CORRECTION