5M5C
Mechanism of microtubule minus-end recognition and protection by CAMSAP proteins
ELECTRON MICROSCOPY
Refinement
RMS Deviations | |
---|---|
Key | Refinement Restraint Deviation |
f_dihedral_angle_d | 4.035 |
f_angle_d | 0.788 |
f_chiral_restr | 0.049 |
f_plane_restr | 0.007 |
f_bond_d | 0.004 |
Sample |
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Complex of two tubulin dimers with bound CAMSAP1-N1492A MUTANT CKK domain |
Sample Components |
tubulin dimer |
CAMSAP1-N1492A MUTANT CKK domain |
Specimen Preparation | |
---|---|
Sample Aggregation State | FILAMENT |
Vitrification Instrument | FEI VITROBOT MARK III |
Cryogen Name | ETHANE |
Sample Vitrification Details |
3D Reconstruction | |
---|---|
Reconstruction Method | SINGLE PARTICLE |
Number of Particles | 6530 |
Reported Resolution (Å) | 4.8 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | Gold-standard noise substitution test used to assess for over fitting (Chen et al., 2013) |
Refinement Type | |
Symmetry Type | POINT |
Map-Model Fitting and Refinement | |||||
---|---|---|---|---|---|
Id | 1 | ||||
Refinement Space | |||||
Refinement Protocol | OTHER | ||||
Refinement Target | |||||
Overall B Value | |||||
Fitting Procedure | |||||
Details |
Data Acquisition | |||||||||
---|---|---|---|---|---|---|---|---|---|
Detector Type | GATAN K2 SUMMIT (4k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 25 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | FEI POLARA 300 |
Minimum Defocus (nm) | |
Maximum Defocus (nm) | |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | |
Nominal Magnification | |
Calibrated Magnification | |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details |
EM Software | ||
---|---|---|
Task | Software Package | Version |
IMAGE ACQUISITION | SerialEM | |
MODEL FITTING | UCSF Chimera | |
INITIAL EULER ASSIGNMENT | SPIDER | |
FINAL EULER ASSIGNMENT | FREALIGN | |
Image Processing | ||||
---|---|---|---|---|
CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
PHASE FLIPPING AND AMPLITUDE CORRECTION | 4144 |