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MicroED structure of tau VQIVYK peptide at 1.1 A resolution
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 29.42 α = 90 b = 4.99 β = 111.55 c = 37.17 γ = 90
Symmetry Space Group C 1 2 1
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 1.1 14.7 83 0.126 0.126 2.4 1.9 6185 3319 8.35
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1 1.1 1.23 79.4 0.472 0.472 1.8 463
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Free (Depositor) R-Free Selection Details Mean Isotropic B ELECTRON CRYSTALLOGRAPHY THROUGHOUT 1.1 14.7 1898 190 81.11 0.211 0.2097 0.2228 RANDOM 13.51
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] 1.6602 3.1898 0.0678 -1.728
RMS Deviations Key Refinement Restraint Deviation t_other_torsion 9.65 t_omega_torsion 1.62 t_angle_deg 0.77 t_bond_d 0.012 t_dihedral_angle_d t_incorr_chiral_ct t_pseud_angle t_trig_c_planes t_gen_planes t_it
Show All KeysRMS Deviations Key Refinement Restraint Deviation t_other_torsion 9.65 t_omega_torsion 1.62 t_angle_deg 0.77 t_bond_d 0.012 t_dihedral_angle_d t_incorr_chiral_ct t_pseud_angle t_trig_c_planes t_gen_planes t_it t_nbd t_improper_torsion t_chiral_improper_torsion t_sum_occupancies t_utility_distance t_utility_angle t_utility_torsion t_ideal_dist_contact
Hide All KeysSoftware Software Software Name Purpose BUSTER refinement
Specimen Preparation Sample Aggregation State 3D ARRAY Vitrification Instrument Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method CRYSTALLOGRAPHY Number of Particles Reported Resolution (Å) 1.1 Resolution Method DIFFRACTION PATTERN/LAYERLINES Other Details Refinement Type Symmetry Type 3D CRYSTAL Space Group Name Length a 29.42 Length b 4.99 Length c 4.99 Angle Alpha 90 Angle Beta 111.55 Angle Gamma 90
Map-Model Fitting and Refinement Id 1 Refinement Space RECIPROCAL Refinement Protocol AB INITIO MODEL Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type TVIPS TEMCAM-F416 (4k x 4k) Electron Dose (electrons/Å**2) 0.002
Imaging Experiment 1 Date of Experiment 2016-04-26 Temperature (Kelvin) Microscope Model FEI TECNAI F20 Minimum Defocus (nm) Maximum Defocus (nm) Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode DIFFRACTION Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 200 Imaging Details
EM Software Task Software Package Version IMAGE ACQUISITION EM-Menu 4.0.9.75 DIFFRACTION INDEXING XDS May 1, 2016 OTHER SHELXT 2014/5 CRYSTALLOGRAPHY MERGING XDS May 1, 2016 MODEL REFINEMENT BUSTER 2.10.0
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details NONE