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Cryo-electron microscopy structure of the hexagonal pre-attachment T4 baseplate-tail tube complex
Starting Model(s) Initial Refinement Model(s) Type Source Accession Code Details experimental model PDB 3H2T experimental model PDB 1N7Z experimental model PDB 1S2E experimental model PDB 2FKK experimental model PDB 1EL6 experimental model PDB 1H6W experimental model PDB 1OCY experimental model PDB 4HRZ experimental model PDB 1K28 experimental model PDB 4KU0
Sample Hexagonal pre-attachment T4 baseplate-tail tube complex
Specimen Preparation Sample Aggregation State PARTICLE Vitrification Instrument FEI VITROBOT MARK IV Cryogen Name ETHANE Sample Vitrification Details Applied 3.5 ul of sample and blotting 3 seconds before plunging
3D Reconstruction Reconstruction Method SINGLE PARTICLE Number of Particles 37913 Reported Resolution (Å) 4.11 Resolution Method FSC 0.143 CUT-OFF Other Details Refinement Type Symmetry Type POINT Point Symmetry C6
Map-Model Fitting and Refinement Id 1 (3H2T, 1N7Z, 1S2E, 2FKK, 1EL6, 1H6W, 1OCY, 4HRZ, 1K28, 4KU0) Refinement Space REAL Refinement Protocol AB INITIO MODEL Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type GATAN K2 SUMMIT (4k x 4k) Electron Dose (electrons/Å**2) 60
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model FEI TITAN KRIOS Minimum Defocus (nm) 500 Maximum Defocus (nm) 4000 Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS 2.7 Imaging Mode BRIGHT FIELD Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER Nominal Magnification 105000 Calibrated Magnification 37700 Source FIELD EMISSION GUN Acceleration Voltage (kV) 300 Imaging Details
EM Software Task Software Package Version PARTICLE SELECTION EMAN 2 CTF CORRECTION CTFFIND 4 CTF CORRECTION RELION 1.4 MODEL FITTING Coot 0.8.2 INITIAL EULER ASSIGNMENT RELION 1.4 FINAL EULER ASSIGNMENT RELION 1.4 RECONSTRUCTION RELION 1.4 MODEL REFINEMENT PHENIX 1.10.1-2155
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING AND AMPLITUDE CORRECTION 47516