A revised partiality model and post-refinement algorithm for X-ray free-electron laser data
Serial Crystallography (SX)
Starting Model(s)
Initial Refinement Model(s) |
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Type | Source | Accession Code | Details |
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|
experimental model | PDB | 4S1L | |
Crystallization
Crystalization Experiments |
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ID | Method | pH | Temperature | Details |
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1 | IN CELL | | 300 | Form naturally within cells |
Crystal Properties |
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Matthews coefficient | Solvent content |
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1.85 | 33.55 |
Crystal Data
Unit Cell |
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Length ( Å ) | Angle ( ˚ ) |
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a = 106.1 | α = 90 |
b = 106.1 | β = 90 |
c = 106.1 | γ = 90 |
Diffraction
Diffraction Experiment |
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
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1 | 1 | x-ray | 298 | PIXEL | CS-PAD CXI-1 | | 2013-03-18 | M | SINGLE WAVELENGTH |
Radiation Source |
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ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
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1 | FREE ELECTRON LASER | SLAC LCLS BEAMLINE CXI | 1.3 | SLAC LCLS | CXI |
Data Collection
Overall |
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot |
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1 | 1.46 | 25.1 | 99.5 | 12 | 45.4 | 34369 | 34369 | | | |
Refinement
Statistics |
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Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work | R-Free | Mean Isotropic B |
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X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | FREE R-VALUE | 4S1L | 1.46 | 25.008 | 1.36 | 34360 | 1720 | 99.53 | 0.1101 | 0.1077 | 0.153 | |
Temperature Factor Modeling |
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Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] |
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| | | | | |
RMS Deviations |
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Key | Refinement Restraint Deviation |
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f_dihedral_angle_d | 14.113 |
f_angle_d | 1.276 |
f_chiral_restr | 0.075 |
f_bond_d | 0.008 |
f_plane_restr | 0.006 |
Non-Hydrogen Atoms Used in Refinement |
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Non-Hydrogen Atoms | Number |
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Protein Atoms | 1884 |
Nucleic Acid Atoms | |
Solvent Atoms | 139 |
Heterogen Atoms | 32 |
Software
Software |
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Software Name | Purpose |
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PHENIX | refinement |
cctbx.xfel | data reduction |
MOLREP | phasing |