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Crystal structure of TENCON variant P40AR2-32R2
Starting Model(s) Initial Refinement Model(s) Type Source Accession Code Details experimental model PDB 3TES PDB ENTRY 3TES
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 VAPOR DIFFUSION, SITTING DROP 6.5 293 0.1 M MES, pH 6.5, 25% PEG3000, 0.2 M ammonium sulfate, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Crystal Properties Matthews coefficient Solvent content 3 59.06
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 84.73 α = 90 b = 84.73 β = 90 c = 127.44 γ = 120
Symmetry Space Group P 61 2 2
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 x-ray 95 CCD RIGAKU SATURN 944 VARIMAX HF 2009-12-17 M SINGLE WAVELENGTH
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 3.4 30 93.8 0.101 16.4 3822 3822 -3 66.5
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1 3.4 3.5 65.3 0.475 12
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Starting model Resolution (High) Resolution (Low) Number Reflections (All) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work (Depositor) R-Work (DCC) R-Free (Depositor) R-Free (DCC) R-Free Selection Details Mean Isotropic B X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT PDB ENTRY 3TES 3.4 15 3603 3603 167 93.8 0.27997 0.27997 0.27748 0.2706 0.33517 0.3337 RANDOM 64.6
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] 5.37 2.68 5.37 -8.05
RMS Deviations Key Refinement Restraint Deviation r_scangle_it 57.102 r_scbond_it 42.878 r_dihedral_angle_2_deg 38.983 r_dihedral_angle_3_deg 20.47 r_dihedral_angle_4_deg 8.585 r_dihedral_angle_1_deg 6.746 r_mcangle_it 1.753 r_angle_refined_deg 1.266 r_mcbond_it 0.905 r_chiral_restr 0.077
RMS Deviations Key Refinement Restraint Deviation r_scangle_it 57.102 r_scbond_it 42.878 r_dihedral_angle_2_deg 38.983 r_dihedral_angle_3_deg 20.47 r_dihedral_angle_4_deg 8.585 r_dihedral_angle_1_deg 6.746 r_mcangle_it 1.753 r_angle_refined_deg 1.266 r_mcbond_it 0.905 r_chiral_restr 0.077 r_bond_refined_d 0.009 r_gen_planes_refined
Non-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 1390 Nucleic Acid Atoms Solvent Atoms Heterogen Atoms
Software Software Software Name Purpose StructureStudio data collection PHASER phasing REFMAC refinement XDS data reduction XDS data scaling