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Crystal Structure of Uncleaved ThnT T282A
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 VAPOR DIFFUSION, SITTING DROP 7.5 298 26% PEG 3350, 0.3M sodium acetate, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Crystal Properties Matthews coefficient Solvent content 2.13 42.14
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 140.754 α = 90 b = 67.959 β = 90 c = 73.507 γ = 90
Symmetry Space Group P 21 21 2
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 x-ray 100 CCD ADSC QUANTUM 270 2011-04-25 M SINGLE WAVELENGTH
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 SYNCHROTRON NSLS BEAMLINE X6A 1.000 NSLS X6A
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 1.5 33.59 95.9 0.055 34.6 7.3 833025 798871 1 1
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1 1.5 1.55 74.2 0.538 2.2 3.2
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Work (DCC) R-Free (Depositor) R-Free (DCC) R-Free Selection Details Mean Isotropic B X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.5 33.59 103037 5428 95.63 0.16617 0.16547 0.1707 0.17967 0.1836 RANDOM 21.239
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] -0.31 0.61 -0.3
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 30.258 r_dihedral_angle_4_deg 21.85 r_dihedral_angle_3_deg 13.462 r_dihedral_angle_1_deg 9.676 r_angle_refined_deg 1.088 r_angle_other_deg 0.66 r_chiral_restr 0.065 r_gen_planes_refined 0.009 r_bond_refined_d 0.005 r_bond_other_d 0.005
Show All KeysRMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 30.258 r_dihedral_angle_4_deg 21.85 r_dihedral_angle_3_deg 13.462 r_dihedral_angle_1_deg 9.676 r_angle_refined_deg 1.088 r_angle_other_deg 0.66 r_chiral_restr 0.065 r_gen_planes_refined 0.009 r_bond_refined_d 0.005 r_bond_other_d 0.005 r_gen_planes_other 0.001
Hide All KeysNon-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 4947 Nucleic Acid Atoms Solvent Atoms 638 Heterogen Atoms
Software Software Software Name Purpose HKL-2000 data collection PHASER phasing REFMAC refinement HKL-2000 data reduction HKL-2000 data scaling