4FQG
Crystal structure of the TCERG1 FF4-6 tandem repeat domain
X-RAY DIFFRACTION
Crystallization
Crystalization Experiments | ||||
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ID | Method | pH | Temperature | Details |
1 | VAPOR DIFFUSION, HANGING DROP | 9 | 277 | 0.016 M NiCl2, 0.1 M Tris-HCl, 16% polyethylene glycol monomethyl ether 2000, and 0.13 M glycine, pH 9, VAPOR DIFFUSION, HANGING DROP, temperature 277K |
Crystal Properties | |
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Matthews coefficient | Solvent content |
2.21 | 44.24 |
Crystal Data
Unit Cell | |
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Length ( Å ) | Angle ( ˚ ) |
a = 27.919 | α = 90 |
b = 77.087 | β = 96.01 |
c = 95.179 | γ = 90 |
Symmetry | |
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Space Group | P 1 21 1 |
Diffraction
Diffraction Experiment | ||||||||||||||
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ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 100 | CCD | MARMOSAIC 225 mm CCD | 2010-04-12 | M | SINGLE WAVELENGTH | ||||||
2 | 1 | x-ray | CCD | MARMOSAIC 225 mm CCD | 2009-12-17 | M | MAD | |||||||
3 | 1 | x-ray | ||||||||||||
4 | 1 | x-ray |
Radiation Source | |||||
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ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 | SYNCHROTRON | APS BEAMLINE 22-BM | 1.0001 | APS | 22-BM |
2 | SYNCHROTRON | APS BEAMLINE 22-BM | 0.9719 | APS | 22-BM |
3 | SYNCHROTRON | APS BEAMLINE 22-BM | 0.9794 | APS | 22-BM |
4 | SYNCHROTRON | APS BEAMLINE 22-BM | 0.9796 | APS | 22-BM |
Data Collection
Overall | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||||||
1,2 | 2 | 50 | 98.3 | 27256 | 26788 | 2 | 2 |
Highest Resolution Shell | |||||||||||||||||||
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ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||||
1,2 | 2 | 2.03 | 99.4 | 0.134 | 11.7 | 4.1 |
Refinement
Statistics | |||||||||||||||||||
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Diffraction ID | Structure Solution Method | Resolution (High) | Resolution (Low) | Number Reflections (All) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work | R-Free | Mean Isotropic B | ||||||||
X-RAY DIFFRACTION | MAD | 2 | 24.797 | 27256 | 26272 | 1314 | 96.45 | 0.1919 | 0.1892 | 0.2408 |
Temperature Factor Modeling | ||||||
---|---|---|---|---|---|---|
Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
0.2353 | 0.3241 | -5.1785 | 4.9432 |
RMS Deviations | |
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Key | Refinement Restraint Deviation |
f_dihedral_angle_d | 12.925 |
f_angle_d | 0.917 |
f_chiral_restr | 0.065 |
f_bond_d | 0.006 |
f_plane_restr | 0.003 |
Non-Hydrogen Atoms Used in Refinement | |
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Non-Hydrogen Atoms | Number |
Protein Atoms | 3193 |
Nucleic Acid Atoms | |
Solvent Atoms | 502 |
Heterogen Atoms | 3 |
Software
Software | |
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Software Name | Purpose |
PHENIX | refinement |
SOLVE | phasing |
REFMAC | refinement |
DENZO | data reduction |
HKL-2000 | data scaling |
HKL-2000 | data collection |