3S93
Crystal structure of conserved motif in TDRD5
X-RAY DIFFRACTION
Crystallization
Crystalization Experiments | ||||
---|---|---|---|---|
ID | Method | pH | Temperature | Details |
1 | 291 | crystal used for final refinement: 1.5 M ammonium phosphate, 0.1 M bis-tris propane. 1:200 trypsin was also added., pH 8.5, vapor diffusion, temperature 291K | ||
2 | 291 | Selenomethionyl derivative: 1.5 M ammonium phosphat e, 0.1 M bis-tris propane. 1:200 trypsin was also added., pH 7, vapor diffusion, temperature 291K | ||
3 | 291 | crystal used for preliminary refinement: 25 w/v% PEG-3350, 0.2 M lithium sulfate, 0.1 M bis-tris propane. 1:200 trypsin was also added., pH 6.5, vapor diffusion, temperature 291K |
Crystal Data
Unit Cell | |
---|---|
Length ( Å ) | Angle ( ˚ ) |
a = 42.94 | α = 90 |
b = 43.33 | β = 90 |
c = 126.6 | γ = 90 |
Symmetry | |
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Space Group | P 21 21 21 |
Diffraction
Diffraction Experiment | ||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
1 | 1 | x-ray | 100 | CCD | RIGAKU SATURN | 2011-04-18 | M | SINGLE WAVELENGTH | ||||||
2 | 2 | x-ray | 100 | CCD | ADSC Q210 BINNED | 2011-05-11 | M | SINGLE WAVELENGTH | ||||||
3 | 3 | x-ray | 100 | CCD | MAR 300 | 2011-05-25 | M | SINGLE WAVELENGTH |
Radiation Source | |||||
---|---|---|---|---|---|
ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
1 | ROTATING ANODE | RIGAKU FR-E | |||
2 | SYNCHROTRON | CHESS BEAMLINE A1 | CHESS | A1 | |
3 | SYNCHROTRON | CLSI BEAMLINE 08ID-1 | CLSI | 08ID-1 |
Data Collection
Overall | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | ||||||||
1 | 2.28 | 30 | 94.8 | 0.038 | 33.8 | 10833 | -3 | 50.51 |
Highest Resolution Shell | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | |||||||||||
1 | 2.28 | 2.34 | 76.9 | 0.791 | 2.8 |
Refinement
Statistics | |||||||||||||||||||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work | R-Free | R-Free Selection Details | Mean Isotropic B | |||||||
X-RAY DIFFRACTION | SAD | THROUGHOUT | 2.28 | 27.48 | 10803 | 575 | 0.246 | 0.245 | 0.271 | THIN SHELLS (SFTOOLS) | 48.56 |
Temperature Factor Modeling | ||||||
---|---|---|---|---|---|---|
Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
2.5105 | -3.3032 | 0.7928 |
RMS Deviations | |
---|---|
Key | Refinement Restraint Deviation |
t_other_torsion | 17.08 |
t_omega_torsion | 2.61 |
t_angle_deg | 1.06 |
t_bond_d | 0.01 |
t_dihedral_angle_d | |
t_incorr_chiral_ct | |
t_pseud_angle | |
t_trig_c_planes | |
t_gen_planes | |
t_it |
Non-Hydrogen Atoms Used in Refinement | |
---|---|
Non-Hydrogen Atoms | Number |
Protein Atoms | 1197 |
Nucleic Acid Atoms | |
Solvent Atoms | 21 |
Heterogen Atoms | 8 |
Software
Software | |
---|---|
Software Name | Purpose |
XSCALE | data scaling |
SOLVE | phasing |
RESOLVE | phasing |
BUSTER-TNT | refinement |
PDB_EXTRACT | data extraction |
BUSTER | refinement |