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Aquifex aeolicus type IIA topoisomerase C-terminal domain
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 VAPOR DIFFUSION, HANGING DROP 7.5 291 50 mM NaCL, 10mM Tris-HCl pH 7.5, 225 mM NH4NO3, 20% PEG 3500, VAPOR DIFFUSION, HANGING DROP, temperature 291K 2 VAPOR DIFFUSION, HANGING DROP 7.5 291 50 mM NaCL, 10mM Tris-HCl pH 7.5, 50mM NaNO3, 20% PEG 3500, 10mM K2Pt(CN4), VAPOR DIFFUSION, HANGING DROP, temperature 291K 3 VAPOR DIFFUSION, HANGING DROP 7.5 291 50 mM NaCL, 10mM Tris-HCl pH 7.5, 50mM NaNO3, 20% PEG 3500, 10 mM K2PtCl4, VAPOR DIFFUSION, HANGING DROP, temperature 291K 4 VAPOR DIFFUSION, HANGING DROP 7.5 291 50 mM NaCL, 10mM Tris-HCl pH 7.5, 50mM NaNO3, 20% PEG 3500, 10 mM NaWO4, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 43.513 α = 91.57 b = 49.624 β = 99.75 c = 120.35 γ = 113.48
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 x-ray 100 CCD ADSC QUANTUM 315r 2007-04-20 M SINGLE WAVELENGTH 2 1 x-ray 100 CCD ADSC QUANTUM 315r 2007-05-09 M SINGLE WAVELENGTH 3 1 x-ray 100 CCD ADSC QUANTUM 315r 2007-05-09 M SINGLE WAVELENGTH 4 1 x-ray 100 CCD ADSC QUANTUM 315r 2007-05-09 M SINGLE WAVELENGTH
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 SYNCHROTRON ALS BEAMLINE 8.3.1 1.1 ALS 8.3.1 2 SYNCHROTRON ALS BEAMLINE 8.3.1 1.071 ALS 8.3.1 3 SYNCHROTRON ALS BEAMLINE 8.3.1 1.071 ALS 8.3.1 4 SYNCHROTRON ALS BEAMLINE 8.3.1 1.214 ALS 8.3.1
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1,2,3,4 1.3 40.851 93.6 0.031 28.2 3.4 222500 208073 -3 15.36
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 1.3 1.315 84.8 0.357 2.4 2.5 18736
Refinement Statistics Diffraction ID Structure Solution Method Resolution (High) Resolution (Low) Number Reflections (All) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Work (DCC) R-Free (Depositor) R-Free (DCC) R-Free Selection Details Mean Isotropic B X-RAY DIFFRACTION MIRAS 1.3004 40.851 222500 208073 10451 93.51 0.1734 0.1725 0.1626 0.1894 0.1795 random, 5%
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] -0.4513 1.3291 0.0436 1.8789 -1.5534 -1.4276
RMS Deviations Key Refinement Restraint Deviation f_dihedral_angle_d 15.415 f_angle_d 1.501 f_chiral_restr 0.089 f_bond_d 0.014 f_plane_restr 0.008
Non-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 6489 Nucleic Acid Atoms Solvent Atoms 948 Heterogen Atoms 70
Software Software Software Name Purpose HKL-2000 data collection SOLVE phasing PHENIX refinement HKL-2000 data reduction SCALA data scaling