☰ Navigation Tabs
Crystal structure of yeast alpha/epsilon-COP subcomplex of the COPI vesicular coat
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 VAPOR DIFFUSION, HANGING DROP 5.5 295 11% PEG 4000, 0.1M sodium citrate, 5mM DTT, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 295K
Crystal Properties Matthews coefficient Solvent content 3.97 68.98
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 176.629 α = 90 b = 176.629 β = 90 c = 141.177 γ = 90
Symmetry Space Group I 4 2 2
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 x-ray 100 CCD ADSC QUANTUM 4 2006-08-24 M MAD 2 1 x-ray 100 CCD ADSC QUANTUM 4 2006-07-28 M SINGLE WAVELENGTH
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 SYNCHROTRON APS BEAMLINE 24-ID-E 0.9792, 0.9794, 0.9642 APS 24-ID-E 2 SYNCHROTRON NSLS BEAMLINE X25 0.9794 NSLS X25
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1,2 2.6 50 99.3 0.05 0.042 28.8 3.9 34363 55.7
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 2.6 2.69 98.8 0.383 0.334 3.3 3.8 3345
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Work (DCC) R-Free (Depositor) R-Free (DCC) R-Free Selection Details Mean Isotropic B X-RAY DIFFRACTION MAD THROUGHOUT 2.6 29.84 32909 1625 95.4 0.222 0.222 0.2214 0.263 0.2604 RANDOM 52.4
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3] 5.9 8.22 -14.11
RMS Deviations Key Refinement Restraint Deviation c_dihedral_angle_d 20.5 c_angle_deg 1.4 c_improper_angle_d 0.92 c_bond_d 0.007 c_bond_d_na c_bond_d_prot c_angle_d c_angle_d_na c_angle_d_prot c_angle_deg_na
Show All KeysRMS Deviations Key Refinement Restraint Deviation c_dihedral_angle_d 20.5 c_angle_deg 1.4 c_improper_angle_d 0.92 c_bond_d 0.007 c_bond_d_na c_bond_d_prot c_angle_d c_angle_d_na c_angle_d_prot c_angle_deg_na c_angle_deg_prot c_dihedral_angle_d_na c_dihedral_angle_d_prot c_improper_angle_d_na c_improper_angle_d_prot c_mcbond_it c_mcangle_it c_scbond_it c_scangle_it
Hide All KeysNon-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 4874 Nucleic Acid Atoms Solvent Atoms 34 Heterogen Atoms
Software Software Software Name Purpose HKL-2000 data collection SOLVE phasing CNS refinement HKL-2000 data reduction HKL-2000 data scaling