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complex of substrate ADP-ribose with HCoV-229E Nsp3 ADRP domain
Crystallization Crystalization Experiments ID Method pH Temperature Details 1 VAPOR DIFFUSION 7.5 291 0.1M HEPES pH 7.5, 25% w/v PEG 3350 , VAPOR DIFFUSION, temperature 291.0K
Crystal Properties Matthews coefficient Solvent content 2.26 45.6
Crystal Data Unit Cell Length ( Å ) Angle ( ˚ ) a = 47.776 α = 90 b = 51.024 β = 90 c = 68.077 γ = 90
Symmetry Space Group P 21 21 21
Diffraction Diffraction Experiment ID # Crystal ID Scattering Type Data Collection Temperature Detector Detector Type Details Collection Date Monochromator Protocol 1 1 x-ray 100 IMAGE PLATE RIGAKU RAXIS IV++ mirrors 2008-05-27 M SINGLE WAVELENGTH
Radiation Source ID # Source Type Wavelength List Synchrotron Site Beamline 1 ROTATING ANODE RIGAKU MICROMAX-007 1.5418
Data Collection Overall ID # Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot 1 2 50 94.8 0.204 5.4 11578
Highest Resolution Shell ID # Resolution (High) Resolution (Low) Percent Possible (All) Percent Possible (Observed) R Merge I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All) 2 2.06 99.3 0.204 5 5.4
Refinement Statistics Diffraction ID Structure Solution Method Cross Validation method Resolution (High) Resolution (Low) Number Reflections (Observed) Number Reflections (R-Free) Percent Reflections (Observed) R-Factor (Observed) R-Work (Depositor) R-Work (DCC) R-Free (Depositor) R-Free (DCC) R-Free Selection Details Mean Isotropic B X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.01 34.88 10993 550 99.33 0.21137 0.20876 0.2042 0.26368 0.2686 RANDOM 27.004
Temperature Factor Modeling Anisotropic B[1][1] Anisotropic B[1][2] Anisotropic B[1][3] Anisotropic B[2][2] Anisotropic B[2][3] Anisotropic B[3][3]
RMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 41.006 r_dihedral_angle_4_deg 20.614 r_dihedral_angle_3_deg 15.308 r_dihedral_angle_1_deg 12.84 r_scangle_it 3.628 r_scbond_it 2.514 r_angle_refined_deg 2.176 r_mcangle_it 1.569 r_mcbond_it 1.039 r_nbtor_refined 0.305
Show All KeysRMS Deviations Key Refinement Restraint Deviation r_dihedral_angle_2_deg 41.006 r_dihedral_angle_4_deg 20.614 r_dihedral_angle_3_deg 15.308 r_dihedral_angle_1_deg 12.84 r_scangle_it 3.628 r_scbond_it 2.514 r_angle_refined_deg 2.176 r_mcangle_it 1.569 r_mcbond_it 1.039 r_nbtor_refined 0.305 r_nbd_refined 0.235 r_symmetry_vdw_refined 0.199 r_chiral_restr 0.166 r_xyhbond_nbd_refined 0.159 r_symmetry_hbond_refined 0.124 r_bond_refined_d 0.021 r_gen_planes_refined 0.008
Hide All KeysNon-Hydrogen Atoms Used in Refinement Non-Hydrogen Atoms Number Protein Atoms 1281 Nucleic Acid Atoms Solvent Atoms 109 Heterogen Atoms 36
Software Software Software Name Purpose HKL-2000 data collection CCP4 model building REFMAC refinement HKL-2000 data reduction HKL-2000 data scaling CCP4 phasing