Experiment: 2QIF

Crystal structure of a metallochaperone with a tetranuclear Cu(I) cluster

X-RAY DIFFRACTION

Crystallization

Crystalization Experiments
ID	Method	pH	Temperature	Details
1	VAPOUR BATCH	4.6	277	Crystallization by vapour batch using 12 microL drops in Terasaki plates covered with a thin layer of silicone oil and equilibrated against 10 % (v/v) isopropanol (24 h) then 20% (v/v) isopropanol for 4 days. 15% (v/v) glycerol added as cryoprotectant., pH 4.6, VAPOUR BATCH, temperature 277K

Crystal Properties
Matthews coefficient	Solvent content
1.98	49.52

Crystal Data

Unit Cell
Length ( Å )	Angle ( ˚ )
a = 23.44	α = 90
b = 74.692	β = 101.55
c = 41.212	γ = 90

Symmetry
Space Group	P 1 21 1

Diffraction

Diffraction Experiment
ID #	Crystal ID	Scattering Type	Data Collection Temperature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1	1	x-ray	100	CCD	ADSC QUANTUM 4	mirror; vertical focusing, glancing angle 3.5 mrad, 7.0 Ang. cut off, 1.2m long silicon substrate, rhodium coated, distance from source 16m	2002-10-24	M	SINGLE WAVELENGTH

Radiation Source
ID #	Source	Type	Wavelength List	Synchrotron Site	Beamline
1	SYNCHROTRON	SRS BEAMLINE PX14.2	0.98	SRS	PX14.2

Data Collection

Overall
ID #	Resolution (High)	Resolution (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1	1.5	30	94.3	0.038	0.038	25.7	3.5		41550			10.5

Highest Resolution Shell
ID #	Resolution (High)	Resolution (Low)	Percent Possible (All)	Percent Possible (Observed)	R Merge I (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.5	1.55	84.9		0.147	0.45	12.4	2.9	3783

Refinement

Statistics
Diffraction ID	Structure Solution Method	Cross Validation method	Resolution (High)	Resolution (Low)	Number Reflections (All)	Number Reflections (Observed)	Number Reflections (R-Free)	Percent Reflections (Observed)	R-Factor (All)	R-Factor (Observed)	R-Work (Depositor)	R-Work (DCC)	R-Free (Depositor)	R-Free (DCC)	R-Free Selection Details	Mean Isotropic B
X-RAY DIFFRACTION	SAD	FREE R	1.5	10	20281	20281	1073	95.9	0.1302	0.1302		0.1276	0.1753	0.1679	RANDOM

Temperature Factor Modeling
Anisotropic B[1][1]	Anisotropic B[1][2]	Anisotropic B[1][3]	Anisotropic B[2][2]	Anisotropic B[2][3]	Anisotropic B[3][3]

Coordinate Error
Structure Solution Method	Refinement High Resolution	Refinement Low Resolution
14		1191.22

RMS Deviations
Key	Refinement Restraint Deviation
s_approx_iso_adps	0.072
s_non_zero_chiral_vol	0.057
s_similar_adp_cmpnt	0.052
s_zero_chiral_vol	0.041
s_angle_d	0.026
s_from_restr_planes	0.0258
s_bond_d	0.009
s_anti_bump_dis_restr	0.009
s_rigid_bond_adp_cmpnt	0.003
s_similar_dist

Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms	Number
Protein Atoms	1007
Nucleic Acid Atoms
Solvent Atoms	166
Heterogen Atoms	19

Software

Software
Software Name	Purpose
DENZO	data reduction
SCALEPACK	data scaling
SHELX	refinement
PDB_EXTRACT	data extraction
ADSC	data collection
SHELX	phasing
SHELXL-97	refinement