Starting Model(s)
| Initial Refinement Model(s) |
|---|
| Type | Source | Accession Code | Details |
|---|
|
experimental model | PDB | 3CNA | PDB ENTRY 3CNA |
Crystallization
| Crystal Properties |
|---|
| Matthews coefficient | Solvent content |
|---|
| 2.3 | 46.5 |
Crystal Data
| Unit Cell |
|---|
| Length ( Å ) | Angle ( ˚ ) |
|---|
| a = 61.954 | α = 90 |
| b = 86.053 | β = 90 |
| c = 89.079 | γ = 90 |
| Symmetry |
|---|
| Space Group | I 2 2 2 |
|---|
Diffraction
| Diffraction Experiment |
|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|
| 1 | 1 | x-ray | 120 | AREA DETECTOR | ADSC | | 1994-08-25 | M | |
| Radiation Source |
|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|
| 1 | ROTATING ANODE | RIGAKU RUH2R | | | |
Data Collection
| Overall |
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot |
|---|
| 1 | 1.15 | | 83.8 | 0.042 | 10.11 | 3.5 | | 112810 | | | |
| Highest Resolution Shell |
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) |
|---|
| 1.15 | 1.25 | 73.6 | | 0.0188 | | 2 | |
Refinement
| Statistics |
|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Number Reflections (All) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (All) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free Selection Details | Mean Isotropic B |
|---|
| X-RAY DIFFRACTION | REFINEMENT | R-FREE | PDB ENTRY 3CNA | 1.15 | | 112810 | | | 0.142 | | 0.1754 | 0.167 | EVERY 10TH REFLECTION | |
| Temperature Factor Modeling |
|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] |
|---|
| | | | | |
| Coordinate Error |
|---|
| Structure Solution Method | Refinement High Resolution | Refinement Low Resolution |
|---|
| 30 | 1754 | 2081.5 |
| RMS Deviations |
|---|
| Key | Refinement Restraint Deviation |
|---|
| s_from_restr_planes | 0.499 |
| s_non_zero_chiral_vol | 0.486 |
| s_angle_d | 0.193 |
| s_zero_chiral_vol | 0.142 |
| s_anti_bump_dis_restr | 0.068 |
| s_approx_iso_adps | 0.059 |
| s_similar_adp_cmpnt | 0.054 |
| s_bond_d | 0.018 |
| s_rigid_bond_adp_cmpnt | 0.006 |
| s_similar_dist | |
| Non-Hydrogen Atoms Used in Refinement |
|---|
| Non-Hydrogen Atoms | Number |
|---|
| Protein Atoms | 1874 |
| Nucleic Acid Atoms | |
| Solvent Atoms | 287 |
| Heterogen Atoms | 2 |
Software
| Software |
|---|
| Software Name | Purpose |
|---|
| SHELXL-92 | model building |
| SHELXL-92 | refinement |
| ADSC | data collection |
| SHELXL-92 | phasing |
