Crystallization
| Crystal Properties |
|---|
| Matthews coefficient | Solvent content |
|---|
| 2.5 | 51 |
Crystal Data
| Unit Cell |
|---|
| Length ( Å ) | Angle ( ˚ ) |
|---|
| a = 89.2 | α = 90 |
| b = 89.2 | β = 90 |
| c = 61.7 | γ = 120 |
| Symmetry |
|---|
| Space Group | P 61 2 2 |
|---|
Diffraction
| Diffraction Experiment |
|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
|---|
| 1 | 1 | x-ray | | AREA DETECTOR | SIEMENS-NICOLET X100 | | 1992-02-09 | M | |
| Radiation Source |
|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline |
|---|
| 1 | | | | | |
Refinement
| Statistics |
|---|
| Diffraction ID | Structure Solution Method | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | Mean Isotropic B |
|---|
| X-RAY DIFFRACTION | | 2 | 6 | 1 | 8539 | | | 0.177 | 0.1769 | | |
| Temperature Factor Modeling |
|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] |
|---|
| | | | | |
| RMS Deviations |
|---|
| Key | Refinement Restraint Deviation |
|---|
| t_dihedral_angle_d | 24 |
| t_angle_deg | 1.6 |
| t_bond_d | 0.012 |
| t_incorr_chiral_ct | |
| t_pseud_angle | |
| t_trig_c_planes | |
| t_gen_planes | |
| t_it | |
| t_nbd | |
| Non-Hydrogen Atoms Used in Refinement |
|---|
| Non-Hydrogen Atoms | Number |
|---|
| Protein Atoms | 998 |
| Nucleic Acid Atoms | |
| Solvent Atoms | 62 |
| Heterogen Atoms | |
Software
| Software |
|---|
| Software Name | Purpose |
|---|
| XENGEN | data collection |
| X-PLOR | model building |
| X-PLOR | refinement |
| XENGEN | data reduction |
| X-PLOR | phasing |
