2ZHC
ParM filament
ELECTRON MICROSCOPY
| Sample |
|---|
| ParM filament |
| Specimen Preparation | |
|---|---|
| Sample Aggregation State | FILAMENT |
| Staining Type | NEGATIVE |
| Staining Material | Uranyl Acetate |
| Staining Details | |
| 3D Reconstruction | |
|---|---|
| Reconstruction Method | HELICAL |
| Number of Particles | 2085 |
| Reported Resolution (Å) | 23 |
| Resolution Method | |
| Other Details | This data was achieved by negative staining experiments |
| Refinement Type | |
| Symmetry Type | HELICAL |
| Map-Model Fitting and Refinement | |||||
|---|---|---|---|---|---|
| Id | 1 (1MWM) | ||||
| Refinement Space | |||||
| Refinement Protocol | |||||
| Refinement Target | |||||
| Overall B Value | |||||
| Fitting Procedure | |||||
| Details | |||||
| Data Acquisition | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| Detector Type | GENERIC FILM | ||||||||
| Electron Dose (electrons/Å**2) | 12 | ||||||||
| Imaging Experiment | 1 |
|---|---|
| Date of Experiment | 2007-01-01 |
| Temperature (Kelvin) | 300 |
| Microscope Model | JEOL 2010HC |
| Minimum Defocus (nm) | 3700 |
| Maximum Defocus (nm) | 10300 |
| Minimum Tilt Angle (degrees) | |
| Maximum Tilt Angle (degrees) | |
| Nominal CS | |
| Imaging Mode | BRIGHT FIELD |
| Specimen Holder Model | |
| Nominal Magnification | 40000 |
| Calibrated Magnification | |
| Source | LAB6 |
| Acceleration Voltage (kV) | 100 |
| Imaging Details |
| EM Software | ||
|---|---|---|
| Task | Software Package | Version |
| RECONSTRUCTION | EOS | |
| Image Processing | ||||
|---|---|---|---|---|
| CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
| Phase and Amplitude | ||||
