8UVF
Structure of NaDC3-DMS complex in Ci-Ci conformation
ELECTRON MICROSCOPY
Sample |
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Dimer of NaDC3 in complex with 2,3-DMS |
Specimen Preparation | |
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Sample Aggregation State | PARTICLE |
Vitrification Instrument | FEI VITROBOT MARK IV |
Cryogen Name | ETHANE |
Sample Vitrification Details |
3D Reconstruction | |
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Reconstruction Method | SINGLE PARTICLE |
Number of Particles | 397856 |
Reported Resolution (Å) | 2.17 |
Resolution Method | FSC 0.143 CUT-OFF |
Other Details | |
Refinement Type | |
Symmetry Type | POINT |
Point Symmetry | C2 |
Map-Model Fitting and Refinement | |||||
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Id | 1 | ||||
Refinement Space | REAL | ||||
Refinement Protocol | OTHER | ||||
Refinement Target | cross-correlation coefficient | ||||
Overall B Value | 43.72 | ||||
Fitting Procedure | |||||
Details | Initial local fitting was done using Chimera and then coot was used for ajustment. |
Data Acquisition | |||||||||
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Detector Type | GATAN K3 BIOQUANTUM (6k x 4k) | ||||||||
Electron Dose (electrons/Å**2) | 52.58 |
Imaging Experiment | 1 |
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Date of Experiment | |
Temperature (Kelvin) | |
Microscope Model | FEI TITAN KRIOS |
Minimum Defocus (nm) | 1200 |
Maximum Defocus (nm) | 1600 |
Minimum Tilt Angle (degrees) | |
Maximum Tilt Angle (degrees) | |
Nominal CS | 2.7 |
Imaging Mode | BRIGHT FIELD |
Specimen Holder Model | FEI TITAN KRIOS AUTOGRID HOLDER |
Nominal Magnification | 105000 |
Calibrated Magnification | 105000 |
Source | FIELD EMISSION GUN |
Acceleration Voltage (kV) | 300 |
Imaging Details |
EM Software | ||
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Task | Software Package | Version |
PARTICLE SELECTION | Warp | 1.0.9 |
PARTICLE SELECTION | Topaz | 0.2.5a |
IMAGE ACQUISITION | Leginon | 3.5 |
CTF CORRECTION | cryoSPARC | 3.3.1 |
MODEL FITTING | UCSF Chimera | 1.15 |
MODEL FITTING | Coot | 0.9.6 |
MODEL REFINEMENT | PHENIX | 1.19.2 |
INITIAL EULER ASSIGNMENT | cryoSPARC | 3.3.1 |
FINAL EULER ASSIGNMENT | cryoSPARC | 3.3.1 |
CLASSIFICATION | cryoSPARC | 3.3.1 |
RECONSTRUCTION | cryoSPARC | 3.3.1 |
Image Processing | ||||
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CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
PHASE FLIPPING AND AMPLITUDE CORRECTION | CTF amplitude correction was performed after particle polishing | Particles were selected form 5850 untilted images and 13540 40 degree tilted images |