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Cryo-EM structure of hAQP2 in DDM
Refinement RMS Deviations Key Refinement Restraint Deviation r_long_range_B_refined 25.357 r_long_range_B_other 25.355 r_mcangle_it 17.127 r_mcangle_other 17.119 r_scangle_other 17.098 r_dihedral_angle_3_deg 17.003 r_mcbond_it 11.471 r_mcbond_other 11.471 r_scbond_it 11.387 r_scbond_other 11.381
Show All KeysRMS Deviations Key Refinement Restraint Deviation r_long_range_B_refined 25.357 r_long_range_B_other 25.355 r_mcangle_it 17.127 r_mcangle_other 17.119 r_scangle_other 17.098 r_dihedral_angle_3_deg 17.003 r_mcbond_it 11.471 r_mcbond_other 11.471 r_scbond_it 11.387 r_scbond_other 11.381 r_dihedral_angle_2_deg 6.751 r_dihedral_angle_1_deg 3.54 r_angle_refined_deg 1.242 r_angle_other_deg 0.39 r_chiral_restr 0.061 r_bond_refined_d 0.008 r_gen_planes_refined 0.006 r_gen_planes_other 0.001 r_bond_other_d r_dihedral_angle_4_deg r_nbd_refined r_nbd_other r_nbtor_refined r_nbtor_other r_xyhbond_nbd_refined r_xyhbond_nbd_other r_metal_ion_refined r_metal_ion_other r_symmetry_vdw_refined r_symmetry_vdw_other r_symmetry_hbond_refined r_symmetry_hbond_other r_symmetry_metal_ion_refined r_symmetry_metal_ion_other r_scangle_it r_rigid_bond_restr r_sphericity_free r_sphericity_bonded
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Sample tetrameter of hAQP2
Specimen Preparation Sample Aggregation State PARTICLE Vitrification Instrument Cryogen Name ETHANE Sample Vitrification Details
3D Reconstruction Reconstruction Method SINGLE PARTICLE Number of Particles 236700 Reported Resolution (Å) 2.89 Resolution Method FSC 0.143 CUT-OFF Other Details Refinement Type Symmetry Type POINT
Map-Model Fitting and Refinement Id 1 Refinement Space Refinement Protocol Refinement Target Overall B Value Fitting Procedure Details
Data Acquisition Detector Type GATAN K2 SUMMIT (4k x 4k) Electron Dose (electrons/Å**2) 69.6
Imaging Experiment 1 Date of Experiment Temperature (Kelvin) Microscope Model JEOL CRYO ARM 300 Minimum Defocus (nm) 1200 Maximum Defocus (nm) 2500 Minimum Tilt Angle (degrees) Maximum Tilt Angle (degrees) Nominal CS Imaging Mode BRIGHT FIELD Specimen Holder Model Nominal Magnification Calibrated Magnification Source FIELD EMISSION GUN Acceleration Voltage (kV) 300 Imaging Details
Image Processing CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details PHASE FLIPPING AND AMPLITUDE CORRECTION