8EAK

SsoMCM hexamer bound to Mg/ADP-BeFx and 46-mer DNA strand. Class 2


ELECTRON MICROSCOPY

Starting Model(s)

Initial Refinement Model(s)
TypeSourceAccession CodeDetails
experimental modelPDB 6MII 

Refinement

RMS Deviations
KeyRefinement Restraint Deviation
f_dihedral_angle_d6.696
f_angle_d0.489
f_chiral_restr0.044
f_bond_d0.004
f_plane_restr0.004
Sample
SsoMCM hexamer bound to Mg/ADP-BeFx and 46-mer DNA strand Class 2
Specimen Preparation
Sample Aggregation StatePARTICLE
Vitrification Instrument
Cryogen NameETHANE
Sample Vitrification Details
3D Reconstruction
Reconstruction MethodSINGLE PARTICLE
Number of Particles448473
Reported Resolution (Å)2.67
Resolution MethodFSC 0.143 CUT-OFF
Other Details
Refinement Type
Symmetry TypePOINT
Point SymmetryC1
Map-Model Fitting and Refinement
Id1 (6MII)
Refinement Space
Refinement ProtocolOTHER
Refinement Target
Overall B Value
Fitting Procedure
DetailsBond distance and angle restraints for a tetrahedral Zn2+ coordination were applied. Bond distance and angle restraints for a octahedral Mg2+ coordina ...Bond distance and angle restraints for a tetrahedral Zn2+ coordination were applied. Bond distance and angle restraints for a octahedral Mg2+ coordination were applied.
Data Acquisition
Detector TypeGATAN K3 (6k x 4k)
Electron Dose (electrons/Å**2)78
Imaging Experiment1
Date of Experiment
Temperature (Kelvin)
Microscope ModelFEI TITAN KRIOS
Minimum Defocus (nm)800
Maximum Defocus (nm)1800
Minimum Tilt Angle (degrees)
Maximum Tilt Angle (degrees)
Nominal CS2.7
Imaging ModeBRIGHT FIELD
Specimen Holder Model
Nominal Magnification
Calibrated Magnification
SourceFIELD EMISSION GUN
Acceleration Voltage (kV)300
Imaging Details
EM Software
TaskSoftware PackageVersion
PARTICLE SELECTIONcryoSPARC2.14.2
IMAGE ACQUISITIONSerialEM
CTF CORRECTIONcryoSPARC2.14.2
MODEL FITTINGPHENIX1.20.1_4487
INITIAL EULER ASSIGNMENTcryoSPARC2.14.2
FINAL EULER ASSIGNMENTcryoSPARC3.31
CLASSIFICATIONcryoSPARC3.31
RECONSTRUCTIONcryoSPARC3.31
MODEL REFINEMENTPHENIX1.20.1_4487
Image Processing
CTF Correction TypeCTF Correction DetailsNumber of Particles SelectedParticle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTIONInitial CTF was calculated by cryoSPARC Patch CTF. CTF parameters were refined during final homogeneous refinement in cryoSPARC.Particles were selected from a subset of micrographs with cryoSPARC blob picker. 2D class averages were calculated, selected and used as templates with cryoSPARC template picker.